KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD
文献类型：期刊论文
| 作者 | DUAN, XF ; WANG, YT ; SHENG, C ; OUYANG, JT |
| 刊名 | PHILOSOPHICAL MAGAZINE LETTERS
 |
| 出版日期 | 1993 |
| 卷号 | 67期号:1页码:1 |
| 关键词 | BEAM ELECTRON-DIFFRACTION |
| ISSN号 | 0950-0839 |
| 通讯作者 | DUAN, XF: CHINESE ACAD SCI,BEIJING LAB ELECTR MICROSCOPY,POB 2724,BEIJING 100080,PEOPLES R CHINA. |
| 中文摘要 | Two samples of nominal 20-period Ge0.20Si0.80(5 nm)/Si(25 nm) and Ge0.5Si0.5(5 nm)/Si(25 nm) strained-layer superlattices (SLSs) were studied by the double-crystal X-ray diffraction method. It is convenient to define the perpendicular strains relative to the average crystal. Computer simulations of the rocking curves were performed using a kinematical step model. An excellent agreement between the measured and simulated satellite patterns is achieved. The dependence of the sensitivity of the rocking curves to the structural parameters of the SLS, such as the alloying concentration x and the layer thicknesses and the L component of the reflection g = (HKL), are clearly demonstrated. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-18 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/40454]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | DUAN, XF,WANG, YT,SHENG, C,et al. KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD[J]. PHILOSOPHICAL MAGAZINE LETTERS,1993,67(1):1. |
| APA | DUAN, XF,WANG, YT,SHENG, C,&OUYANG, JT.(1993).KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD.PHILOSOPHICAL MAGAZINE LETTERS,67(1),1. |
| MLA | DUAN, XF,et al."KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD".PHILOSOPHICAL MAGAZINE LETTERS 67.1(1993):1. |
入库方式： OAI收割
来源：物理研究所
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