中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Measurement of spatial fidelity in photorefractive image amplification with an applied electric field

文献类型:期刊论文

作者Wu, JI ; Xie, P ; Dai, JH ; Wang, PY ; Zhang, HJ
刊名JOURNAL OF PHYSICS D-APPLIED PHYSICS
出版日期1998
卷号31期号:2页码:172
关键词BI12SIO20 CRYSTALS ENERGY-TRANSFER MEDIA
ISSN号0022-3727
通讯作者Wu, JI: Chinese Acad Sci, Inst Phys, Lab Opt Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要The spatial fidelity and the gain in coherent amplification of images by two-wave coupling in a photorefractive crystal are qualitatively investigated, The spatial fidelity is degraded mainly because the spatial frequencies present in the image-bearing beam propagate at different angles with respect to the pump and thus experience different gains and different phase shifts in the crystal. The fidelity is shown to depend on the interbeam angle and the applied electric field.
收录类别SCI
语种英语
公开日期2013-09-18
源URL[http://ir.iphy.ac.cn/handle/311004/41825]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Wu, JI,Xie, P,Dai, JH,et al. Measurement of spatial fidelity in photorefractive image amplification with an applied electric field[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,1998,31(2):172.
APA Wu, JI,Xie, P,Dai, JH,Wang, PY,&Zhang, HJ.(1998).Measurement of spatial fidelity in photorefractive image amplification with an applied electric field.JOURNAL OF PHYSICS D-APPLIED PHYSICS,31(2),172.
MLA Wu, JI,et al."Measurement of spatial fidelity in photorefractive image amplification with an applied electric field".JOURNAL OF PHYSICS D-APPLIED PHYSICS 31.2(1998):172.

入库方式: OAI收割

来源:物理研究所

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