Measurement of spatial fidelity in photorefractive image amplification with an applied electric field
文献类型:期刊论文
作者 | Wu, JI ; Xie, P ; Dai, JH ; Wang, PY ; Zhang, HJ |
刊名 | JOURNAL OF PHYSICS D-APPLIED PHYSICS
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出版日期 | 1998 |
卷号 | 31期号:2页码:172 |
关键词 | BI12SIO20 CRYSTALS ENERGY-TRANSFER MEDIA |
ISSN号 | 0022-3727 |
通讯作者 | Wu, JI: Chinese Acad Sci, Inst Phys, Lab Opt Phys, POB 603, Beijing 100080, Peoples R China. |
中文摘要 | The spatial fidelity and the gain in coherent amplification of images by two-wave coupling in a photorefractive crystal are qualitatively investigated, The spatial fidelity is degraded mainly because the spatial frequencies present in the image-bearing beam propagate at different angles with respect to the pump and thus experience different gains and different phase shifts in the crystal. The fidelity is shown to depend on the interbeam angle and the applied electric field. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-18 |
源URL | [http://ir.iphy.ac.cn/handle/311004/41825] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Wu, JI,Xie, P,Dai, JH,et al. Measurement of spatial fidelity in photorefractive image amplification with an applied electric field[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,1998,31(2):172. |
APA | Wu, JI,Xie, P,Dai, JH,Wang, PY,&Zhang, HJ.(1998).Measurement of spatial fidelity in photorefractive image amplification with an applied electric field.JOURNAL OF PHYSICS D-APPLIED PHYSICS,31(2),172. |
MLA | Wu, JI,et al."Measurement of spatial fidelity in photorefractive image amplification with an applied electric field".JOURNAL OF PHYSICS D-APPLIED PHYSICS 31.2(1998):172. |
入库方式: OAI收割
来源:物理研究所
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