Metallization of Cu3N semiconductor under high pressure
文献类型:期刊论文
作者 | Yang, LX ; Zhao, JG ; Yu, Y ; Li, FY ; Yu, RC ; Jin, CQ |
刊名 | CHINESE PHYSICS LETTERS
![]() |
出版日期 | 2006 |
卷号 | 23期号:2页码:426 |
关键词 | INDUCED SUPERCONDUCTIVITY |
ISSN号 | 0256-307X |
通讯作者 | Jin, CQ: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
中文摘要 | Using the four-probe method, we investigate the electrical conductivity of Cu3N under high pressure with the diamond anvil cell. Cu3N is a semiconductor at ambient pressure showing a band gap about 1 eV. With the application of quasi-hydrostatic pressures, its resistance decreases dramatically over five orders of magnitude from ambient to 9 GPa. The compound became a metal at pressure about 5.5 GPa, which is in well agreement with the recent first principle calculation. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-18 |
源URL | [http://ir.iphy.ac.cn/handle/311004/41933] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Yang, LX,Zhao, JG,Yu, Y,et al. Metallization of Cu3N semiconductor under high pressure[J]. CHINESE PHYSICS LETTERS,2006,23(2):426. |
APA | Yang, LX,Zhao, JG,Yu, Y,Li, FY,Yu, RC,&Jin, CQ.(2006).Metallization of Cu3N semiconductor under high pressure.CHINESE PHYSICS LETTERS,23(2),426. |
MLA | Yang, LX,et al."Metallization of Cu3N semiconductor under high pressure".CHINESE PHYSICS LETTERS 23.2(2006):426. |
入库方式: OAI收割
来源:物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。