Microstructural characterization of YBCO thin films grown on YSZ
文献类型：期刊论文
| 作者 | Liu, CX ; Chen, XM ; Tang, WH ; Wang, Y ; Xu, M ; Mai, ZH ; Jia, QJ ; Zheng, WL ; Jiang, XM ; Gao, J |
| 刊名 | HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
 |
| 出版日期 | 2001 |
| 卷号 | 25页码:96 |
| 关键词 | ULTRATHIN FILMS YBA2CU3OX THIN BUFFER LAYER |
| ISSN号 | 0254-3052 |
| 通讯作者 | Liu, CX: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | BaTiO3/SrTiO3 (BTO/STO) superlattices were examined by using X-ray grazing incidence diffraction under total external reflection conditions and ordinary Bragg diffraction. Dynamical diffraction theory was used to simulate Bragg diffractions. It is shown that, these superlattices partially relaxed. However, unlike semiconductor epilayers or superlattices, the lattice constants of BTO/STO superlattices do not completely obey the role of tetragonal distortion. The perpendicular lattice constants deviate slightly from that predicted by elasticity theory. These deviations are probably relevant to the structures of oxide materials. |
| 收录类别 | SCI |
| 语种 | 中文 |
| 公开日期 | 2013-09-18 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/42040]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Liu, CX,Chen, XM,Tang, WH,et al. Microstructural characterization of YBCO thin films grown on YSZ[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2001,25:96. |
| APA | Liu, CX.,Chen, XM.,Tang, WH.,Wang, Y.,Xu, M.,...&Gao, J.(2001).Microstructural characterization of YBCO thin films grown on YSZ.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,25,96. |
| MLA | Liu, CX,et al."Microstructural characterization of YBCO thin films grown on YSZ".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 25(2001):96. |
入库方式： OAI收割
来源：物理研究所
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