中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Microstructural characterization of YBCO thin films grown on YSZ

文献类型:期刊论文

作者Liu, CX ; Chen, XM ; Tang, WH ; Wang, Y ; Xu, M ; Mai, ZH ; Jia, QJ ; Zheng, WL ; Jiang, XM ; Gao, J
刊名HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
出版日期2001
卷号25页码:96
关键词ULTRATHIN FILMS YBA2CU3OX THIN BUFFER LAYER
ISSN号0254-3052
通讯作者Liu, CX: Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要BaTiO3/SrTiO3 (BTO/STO) superlattices were examined by using X-ray grazing incidence diffraction under total external reflection conditions and ordinary Bragg diffraction. Dynamical diffraction theory was used to simulate Bragg diffractions. It is shown that, these superlattices partially relaxed. However, unlike semiconductor epilayers or superlattices, the lattice constants of BTO/STO superlattices do not completely obey the role of tetragonal distortion. The perpendicular lattice constants deviate slightly from that predicted by elasticity theory. These deviations are probably relevant to the structures of oxide materials.
收录类别SCI
语种中文
公开日期2013-09-18
源URL[http://ir.iphy.ac.cn/handle/311004/42040]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Liu, CX,Chen, XM,Tang, WH,et al. Microstructural characterization of YBCO thin films grown on YSZ[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2001,25:96.
APA Liu, CX.,Chen, XM.,Tang, WH.,Wang, Y.,Xu, M.,...&Gao, J.(2001).Microstructural characterization of YBCO thin films grown on YSZ.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,25,96.
MLA Liu, CX,et al."Microstructural characterization of YBCO thin films grown on YSZ".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 25(2001):96.

入库方式: OAI收割

来源:物理研究所

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