Microstructure investigation on barrier shapes of double barrier magnetic tunnel junctions
文献类型:期刊论文
作者 | Wang, Y ; Zeng, ZM ; Rehana, S ; Han, XF ; Sun, XC ; Zhang, Z |
刊名 | JOURNAL OF APPLIED PHYSICS
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出版日期 | 2006 |
卷号 | 100期号:5 |
关键词 | AXIS ELECTRON HOLOGRAPHY ROOM-TEMPERATURE BIAS VOLTAGE THIN-FILMS MAGNETORESISTANCE DEPENDENCE MICROSCOPY |
ISSN号 | 0021-8979 |
通讯作者 | Han, XF: Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China. |
中文摘要 | Barrier shapes and its detailed microstructures in the double barrier magnetic tunnel junctions were intensively investigated by both high resolution transmission electron microscopy and electron holography. Two broad (> 2 nm) potential wells (i.e., shapes of AlO(x) layers) with slanted interfaces were observed in the electron hologram of the as-deposited samples. However, in the hologram of the annealed samples, two narrowed (down to 1.18 nm) and almost equal (height) potential wells with sharp and steep interfaces were acquired. This indicates that the value of tunnel magnetoresistance can be increased from 12.8% to 29.4% at room temperature by annealing treatment where the sharpness and height of the barriers played a critical role. (c) 2006 American Institute of Physics. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-18 |
源URL | [http://ir.iphy.ac.cn/handle/311004/42109] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Wang, Y,Zeng, ZM,Rehana, S,et al. Microstructure investigation on barrier shapes of double barrier magnetic tunnel junctions[J]. JOURNAL OF APPLIED PHYSICS,2006,100(5). |
APA | Wang, Y,Zeng, ZM,Rehana, S,Han, XF,Sun, XC,&Zhang, Z.(2006).Microstructure investigation on barrier shapes of double barrier magnetic tunnel junctions.JOURNAL OF APPLIED PHYSICS,100(5). |
MLA | Wang, Y,et al."Microstructure investigation on barrier shapes of double barrier magnetic tunnel junctions".JOURNAL OF APPLIED PHYSICS 100.5(2006). |
入库方式: OAI收割
来源:物理研究所
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