中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Moire fringes of HOPG and mica in scanning probe microscopy

文献类型:期刊论文

作者Guo, HM ; Liu, HW ; Wang, YL ; Xie, HM ; Dai, FL ; Gao, HJ
刊名ACTA PHYSICA SINICA
出版日期2003
卷号52期号:10页码:2514
关键词ELECTRON-BEAM LITHOGRAPHY DEFORMATION MEASUREMENT SURFACE GROWTH SI(111)-(7X7) AU(111) GE
ISSN号1000-3290
通讯作者Guo, HM: Chinese Acad Sci, Inst Phys, Nanoscale Phys & Devices Lab, POB 603, Beijing 100080, Peoples R China.
中文摘要A Moire technique using a scanning probe microscope (SPM) is developed, in which the natural periodic structure of a crystal is used as an ideal spacing grating. Formation principle of the SPM moire fringes is discussed. Moire patterns formed on highly oriented pyrolytic graphite (HOPG) and mica are investigated experimentally with STM and AFM, respectively. The results demonstrate the feasibility of the SPM Moire technique in studying deformation and defects of crystals at the nanometer scale.
收录类别SCI
语种中文
公开日期2013-09-18
源URL[http://ir.iphy.ac.cn/handle/311004/42245]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Guo, HM,Liu, HW,Wang, YL,et al. Moire fringes of HOPG and mica in scanning probe microscopy[J]. ACTA PHYSICA SINICA,2003,52(10):2514.
APA Guo, HM,Liu, HW,Wang, YL,Xie, HM,Dai, FL,&Gao, HJ.(2003).Moire fringes of HOPG and mica in scanning probe microscopy.ACTA PHYSICA SINICA,52(10),2514.
MLA Guo, HM,et al."Moire fringes of HOPG and mica in scanning probe microscopy".ACTA PHYSICA SINICA 52.10(2003):2514.

入库方式: OAI收割

来源:物理研究所

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