Moire fringes of HOPG and mica in scanning probe microscopy
文献类型:期刊论文
作者 | Guo, HM ; Liu, HW ; Wang, YL ; Xie, HM ; Dai, FL ; Gao, HJ |
刊名 | ACTA PHYSICA SINICA
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出版日期 | 2003 |
卷号 | 52期号:10页码:2514 |
关键词 | ELECTRON-BEAM LITHOGRAPHY DEFORMATION MEASUREMENT SURFACE GROWTH SI(111)-(7X7) AU(111) GE |
ISSN号 | 1000-3290 |
通讯作者 | Guo, HM: Chinese Acad Sci, Inst Phys, Nanoscale Phys & Devices Lab, POB 603, Beijing 100080, Peoples R China. |
中文摘要 | A Moire technique using a scanning probe microscope (SPM) is developed, in which the natural periodic structure of a crystal is used as an ideal spacing grating. Formation principle of the SPM moire fringes is discussed. Moire patterns formed on highly oriented pyrolytic graphite (HOPG) and mica are investigated experimentally with STM and AFM, respectively. The results demonstrate the feasibility of the SPM Moire technique in studying deformation and defects of crystals at the nanometer scale. |
收录类别 | SCI |
语种 | 中文 |
公开日期 | 2013-09-18 |
源URL | [http://ir.iphy.ac.cn/handle/311004/42245] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Guo, HM,Liu, HW,Wang, YL,et al. Moire fringes of HOPG and mica in scanning probe microscopy[J]. ACTA PHYSICA SINICA,2003,52(10):2514. |
APA | Guo, HM,Liu, HW,Wang, YL,Xie, HM,Dai, FL,&Gao, HJ.(2003).Moire fringes of HOPG and mica in scanning probe microscopy.ACTA PHYSICA SINICA,52(10),2514. |
MLA | Guo, HM,et al."Moire fringes of HOPG and mica in scanning probe microscopy".ACTA PHYSICA SINICA 52.10(2003):2514. |
入库方式: OAI收割
来源:物理研究所
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