Monolayer oscillation observed by an oblique-incidence reflectance difference technique for the epitaxial growth of oxides
文献类型：期刊论文
| 作者 | Chen, F ; Lu, HB ; Zhao, T ; Chen, ZH ; Yang, GZ ; Zhu, XD |
| 刊名 | CHINESE PHYSICS LETTERS
 |
| 出版日期 | 2001 |
| 卷号 | 18期号:5页码:665 |
| 关键词 | MOLECULAR-BEAM EPITAXY UNIT-CELL DIFFRACTION SURFACES SRTIO3 FILM |
| ISSN号 | 0256-307X |
| 通讯作者 | Chen, F: Chinese Acad Sci, Lab Opt Phys, Inst Phys, Beijing 100080, Peoples R China. |
| 中文摘要 | We report the optical oscillations with monolayer periodicity observed by an oblique-incidence reflectance difference (OIRD) technique on the epitaxial growth of Nb-doped SrTiO3 on SrTiO3 substrate. The periodicity was verified by the simultaneously measured reflection high-energy electron diffraction intensity oscillations. The OIRD oscillation damps during deposition, but can recover after the growth is interrupted for some time. We interpret the optical oscillations as a result of the periodic changes of the surface morphologies due to the two-dimensional layer-by-layer growth of thin films. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-18 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/42293]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Chen, F,Lu, HB,Zhao, T,et al. Monolayer oscillation observed by an oblique-incidence reflectance difference technique for the epitaxial growth of oxides[J]. CHINESE PHYSICS LETTERS,2001,18(5):665. |
| APA | Chen, F,Lu, HB,Zhao, T,Chen, ZH,Yang, GZ,&Zhu, XD.(2001).Monolayer oscillation observed by an oblique-incidence reflectance difference technique for the epitaxial growth of oxides.CHINESE PHYSICS LETTERS,18(5),665. |
| MLA | Chen, F,et al."Monolayer oscillation observed by an oblique-incidence reflectance difference technique for the epitaxial growth of oxides".CHINESE PHYSICS LETTERS 18.5(2001):665. |
入库方式： OAI收割
来源：物理研究所
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