中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Temperature dependent x-ray diffraction study on Gd5Sn4 compound

文献类型:期刊论文

作者Yang, HF ; Rao, GH ; Liu, GY ; Ouyang, ZW ; Liu, WF ; Feng, XM ; Chu, WG ; Liang, JK
刊名JOURNAL OF ALLOYS AND COMPOUNDS
出版日期2004
卷号368期号:1-2页码:248
关键词ELECTRICAL-RESISTANCE MAGNETIC-FIELD TRANSITION GD-5(SI2GE2)
ISSN号0925-8388
通讯作者Yang, HF (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要The structure and the magnetic properties of the Gd5Sn4 compound have been investigated by means of X-ray diffraction (XRD) and magnetization measurements. Temperature dependent XRD investigation reveals that there is no structural transition around the temperature at which the first-order magnetic transition occurs in this compound, i.e. the compound retains the Sm5Ge4-type structure from 80 K(T-C), which is different from the Gd-5(Si, Ge)(4) system. Based on the Rietveld refinement of the XRD pattern of Gd5Sn4 compound, we show that the unit cell volume exhibits a dip near the Curie temperature, i.e. a negative coefficient of thermal expansion alpha approximate to -1.5 x 10(-4) K-1 from 82 to 90 K and a positive coefficient alpha approximate to 2.2 x 10(-4) K-1 from 90 to 98 K. The coefficient of thermal expansion from 98 to 298 K is only 2.5 x 10(-5) K-1. (C) 2003 Elsevier B.V. All rights reserved.
收录类别SCI
语种英语
公开日期2013-09-23
源URL[http://ir.iphy.ac.cn/handle/311004/44790]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Yang, HF,Rao, GH,Liu, GY,et al. Temperature dependent x-ray diffraction study on Gd5Sn4 compound[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2004,368(1-2):248.
APA Yang, HF.,Rao, GH.,Liu, GY.,Ouyang, ZW.,Liu, WF.,...&Liang, JK.(2004).Temperature dependent x-ray diffraction study on Gd5Sn4 compound.JOURNAL OF ALLOYS AND COMPOUNDS,368(1-2),248.
MLA Yang, HF,et al."Temperature dependent x-ray diffraction study on Gd5Sn4 compound".JOURNAL OF ALLOYS AND COMPOUNDS 368.1-2(2004):248.

入库方式: OAI收割

来源:物理研究所

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