The combining analysis of height and phase images in tapping-mode atomic force microscopy: a new route for the characterization of thiol-coated gold nanoparticle film on solid substrate
文献类型：期刊论文
| 作者 | Jiang, P ; Xie, SS ; Pang, SJ ; Gao, HJ |
| 刊名 | APPLIED SURFACE SCIENCE
 |
| 出版日期 | 2002 |
| 卷号 | 191期号:1-4页码:240 |
| 关键词 | SELF-ORGANIZATION ALKANETHIOLATE MONOLAYERS NANOCRYSTAL SUPERLATTICES SILVER NANOPARTICLES SIZE PARTICLES GROWTH 2D CLUSTERS ARRAYS |
| ISSN号 | 0169-4332 |
| 通讯作者 | Jiang, P (reprint author), Max Planck Gesell, Fritz Haber Inst, Dept Phys Chem, Faradayweg 4-6, D-14195 Berlin, Germany. |
| 中文摘要 | For the objective of future advice manufacture, the morphological change of the films formed on highly oriented pyrolytic graphite (HOPG) by evaporating 1-nonanethiol-protected 5 nm sized gold (Au) nanoparticle chloroform solution at various concentrations under chosen atmosphere conditions was investigated by tapping-mode atomic force microscopy (TM-AFM). The topography and phase images were simultaneously recorded to extract information on the film structures. The results show that the structure of the nanoparticle film, which varies from narrow belts, monolayer to bilayers with the increase of particle concentration, can be clearly distinguished by the combining analysis of TM-AFM topographical and phase images. This is further verified by corresponding TEM characterizations, too. The investigation demonstrates a new possible routine for the characterization of the devices based on nanoparticle film. (C) 2002 Elsevier Science B.V. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-23 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/44930]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Jiang, P,Xie, SS,Pang, SJ,et al. The combining analysis of height and phase images in tapping-mode atomic force microscopy: a new route for the characterization of thiol-coated gold nanoparticle film on solid substrate[J]. APPLIED SURFACE SCIENCE,2002,191(1-4):240. |
| APA | Jiang, P,Xie, SS,Pang, SJ,&Gao, HJ.(2002).The combining analysis of height and phase images in tapping-mode atomic force microscopy: a new route for the characterization of thiol-coated gold nanoparticle film on solid substrate.APPLIED SURFACE SCIENCE,191(1-4),240. |
| MLA | Jiang, P,et al."The combining analysis of height and phase images in tapping-mode atomic force microscopy: a new route for the characterization of thiol-coated gold nanoparticle film on solid substrate".APPLIED SURFACE SCIENCE 191.1-4(2002):240. |
入库方式： OAI收割
来源：物理研究所
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