The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films
文献类型:期刊论文
作者 | Chen, XM ; Wang, Y ; Liu, CX ; Zhao, YN ; Mai, ZH ; Gong, WZ ; Zhao, BR ; Jia, CJ ; Zheng, WL |
刊名 | INTERNATIONAL JOURNAL OF MODERN PHYSICS B
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出版日期 | 2002 |
卷号 | 16期号:23页码:3439 |
关键词 | LOW-FIELD MAGNETORESISTANCE THIN-FILMS LA0.67CA0.33MNO3 FILMS MAGNETIC-ANISOTROPY STRAIN DOTS LA0.7CA0.3MNO3 ISLANDS GAAS |
ISSN号 | 0217-9792 |
通讯作者 | Chen, XM (reprint author), Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China. |
中文摘要 | La0.5Ca0.5MnO3 (LCMO) thin films grown on SrTiO3 substrate with different thickness were investigated using high resolution X-ray diffraction, small angle reflectivity, and atomic force microscope (AFM). All the films are demonstrated to be c-axis oriented. The surface and interface structure of the films were obtained. It was found that the surface morphology of the films strongly depends on the thickness, and the film will crack when the thickness of the film reach a critical thickness. The surface roughness of the films increases with the thickness. The interface between the films and the substrates are very clear. There exists a non-designed cap layer on the surface of the LCMO layer. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-23 |
源URL | [http://ir.iphy.ac.cn/handle/311004/45032] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Chen, XM,Wang, Y,Liu, CX,et al. The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films[J]. INTERNATIONAL JOURNAL OF MODERN PHYSICS B,2002,16(23):3439. |
APA | Chen, XM.,Wang, Y.,Liu, CX.,Zhao, YN.,Mai, ZH.,...&Zheng, WL.(2002).The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films.INTERNATIONAL JOURNAL OF MODERN PHYSICS B,16(23),3439. |
MLA | Chen, XM,et al."The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films".INTERNATIONAL JOURNAL OF MODERN PHYSICS B 16.23(2002):3439. |
入库方式: OAI收割
来源:物理研究所
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