中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
The Kapitza resistance across grain boundary by molecular dynamics simulation

文献类型:期刊论文

作者Tang, QH ; Yao, YG
刊名NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING
出版日期2006
卷号10期号:4页码:387
关键词THERMAL-CONDUCTIVITY THIN-FILMS PHONON-SCATTERING SILICON TRANSPORT PHASES ORDER
ISSN号1556-7265
通讯作者Tang, QH (reprint author), Chinese Acad Sci, State Key Lab Nonlinear Mech, Inst Mech, 15 Beisihuanxi Rd, Beijing 100080, Peoples R China.
中文摘要Nonequilibrium molecular dynamics (NEMD) simulations are performed to calculate thermal boundary resistance that arises from heat flow across Si grain boundary. The environment-dependent interatomic potential (EDIP) on crystal silicon is adopted as a model system. The issues are related to nonlinear response, local thermal equilibrium, and statistical averaging. The tilt grain boundaries Sigma 5 and Sigma 13 are simulated, and the values of thermal boundary resistance by nonequilibrium molecular dynamics are compared with those by Maid et al. (Solid State Communications, vol. 102, 1997). Using the disperse relation of EDIP potential, an average transmission coefficient of thermal conductivity across boundary is calculated.
收录类别SCI
语种英语
公开日期2013-09-23
源URL[http://ir.iphy.ac.cn/handle/311004/45282]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Tang, QH,Yao, YG. The Kapitza resistance across grain boundary by molecular dynamics simulation[J]. NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING,2006,10(4):387.
APA Tang, QH,&Yao, YG.(2006).The Kapitza resistance across grain boundary by molecular dynamics simulation.NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING,10(4),387.
MLA Tang, QH,et al."The Kapitza resistance across grain boundary by molecular dynamics simulation".NANOSCALE AND MICROSCALE THERMOPHYSICAL ENGINEERING 10.4(2006):387.

入库方式: OAI收割

来源:物理研究所

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