Thickness dependence of the coercive field in ferroelectric thin films
文献类型：期刊论文
| 作者 | Hu, ZN ; Lo, VC |
| 刊名 | INTERNATIONAL JOURNAL OF MODERN PHYSICS B
 |
| 出版日期 | 2006 |
| 卷号 | 20期号:22页码:3223 |
| 关键词 | BOUNDARY-CONDITIONS DOMAIN-STRUCTURE ULTRATHIN FILMS NANOSCALE SIZE NUCLEATION FATIGUE STRESS |
| ISSN号 | 0217-9792 |
| 通讯作者 | Hu, ZN (reprint author), Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China. |
| 中文摘要 | By considering the effects of the space charges and domain boundaries in ferroelectric thin films, the thickness dependence of coercive field (E-c) is numerically simulated based on the four-state Potts model with the nearest-neighbor interactions between dipole moments. For large thickness, experimental results where E, decreases with thickness can be produced from our Monte-Carlo simulation. On the other hand, when the thickness is very small, our simulation gets that Ec increases with thickness by the study of the polarization switching in the film. This gives an explanation of the experimental result by Zhu et al. in J. Appl. Phys. 83, 1 (1998) for SBT-BTN film, and a similar report by Bune et al. in Nature 391, 874 (1998) for the crystalline film. The critical temperature of the thin film is also discussed. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-23 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/45825]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Hu, ZN,Lo, VC. Thickness dependence of the coercive field in ferroelectric thin films[J]. INTERNATIONAL JOURNAL OF MODERN PHYSICS B,2006,20(22):3223. |
| APA | Hu, ZN,&Lo, VC.(2006).Thickness dependence of the coercive field in ferroelectric thin films.INTERNATIONAL JOURNAL OF MODERN PHYSICS B,20(22),3223. |
| MLA | Hu, ZN,et al."Thickness dependence of the coercive field in ferroelectric thin films".INTERNATIONAL JOURNAL OF MODERN PHYSICS B 20.22(2006):3223. |
入库方式： OAI收割
来源：物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。