中国科学院机构知识库网格
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Thickness dependence of the coercive field in ferroelectric thin films

文献类型:期刊论文

作者Hu, ZN ; Lo, VC
刊名INTERNATIONAL JOURNAL OF MODERN PHYSICS B
出版日期2006
卷号20期号:22页码:3223
关键词BOUNDARY-CONDITIONS DOMAIN-STRUCTURE ULTRATHIN FILMS NANOSCALE SIZE NUCLEATION FATIGUE STRESS
ISSN号0217-9792
通讯作者Hu, ZN (reprint author), Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China.
中文摘要By considering the effects of the space charges and domain boundaries in ferroelectric thin films, the thickness dependence of coercive field (E-c) is numerically simulated based on the four-state Potts model with the nearest-neighbor interactions between dipole moments. For large thickness, experimental results where E, decreases with thickness can be produced from our Monte-Carlo simulation. On the other hand, when the thickness is very small, our simulation gets that Ec increases with thickness by the study of the polarization switching in the film. This gives an explanation of the experimental result by Zhu et al. in J. Appl. Phys. 83, 1 (1998) for SBT-BTN film, and a similar report by Bune et al. in Nature 391, 874 (1998) for the crystalline film. The critical temperature of the thin film is also discussed.
收录类别SCI
语种英语
公开日期2013-09-23
源URL[http://ir.iphy.ac.cn/handle/311004/45825]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
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GB/T 7714
Hu, ZN,Lo, VC. Thickness dependence of the coercive field in ferroelectric thin films[J]. INTERNATIONAL JOURNAL OF MODERN PHYSICS B,2006,20(22):3223.
APA Hu, ZN,&Lo, VC.(2006).Thickness dependence of the coercive field in ferroelectric thin films.INTERNATIONAL JOURNAL OF MODERN PHYSICS B,20(22),3223.
MLA Hu, ZN,et al."Thickness dependence of the coercive field in ferroelectric thin films".INTERNATIONAL JOURNAL OF MODERN PHYSICS B 20.22(2006):3223.

入库方式: OAI收割

来源:物理研究所

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