Tribological properties of fullerenes C-60 and C-70 microparticles
文献类型:期刊论文
作者 | Zhao, W ; Tang, JK ; Puri, A ; Sweany, RL ; Li, YX ; Chen, LQ |
刊名 | JOURNAL OF MATERIALS RESEARCH
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出版日期 | 1996 |
卷号 | 11期号:11页码:2749 |
关键词 | X-RAY STRUCTURE SOLVATED C60 SOLID-STATE FILMS BUCKMINSTERFULLERENE BEHAVIOR DISORDER LAYERS FORM C70 |
ISSN号 | 0884-2914 |
通讯作者 | Zhao, W (reprint author), UNIV NEW ORLEANS,DEPT PHYS,NEW ORLEANS,LA 70148, USA. |
中文摘要 | The frictional behaviors of fullerenes C-60 and C-70 were studied because they were speculated to be solid lubricants. For the sublimated pure C-60 films on Si(001), a high friction coefficient (0.55-0.8) was observed under different loads and pin materials. For the C-70 film, the friction coefficient showed a pin dependence, which changed from 0.5 with an Al2O3 pin to about 0.9 with a 440 stainless steel pin. The relatively high friction coefficients of C-60 and C-70 films were due to the tendency of the C-60 and C-70 particles to clump and compress into high shear strength layers rather than due to the impurities in the fullerenes. The benzene-solvated C-60. 4C(6)H(6) and C-70. xC(6)H(6) showed a lowered friction coefficient (0.25 for C-60. 4C(6)H(6) and 0.3 for C-70. xC(6)H(6)), which might result from the lowered shear strength of the hcp structure of C-60. 4C(6)H(6) and C-70. xC(6)H(6) molecular crystals in which the benzene molecules were intercalated. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-23 |
源URL | [http://ir.iphy.ac.cn/handle/311004/46147] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Zhao, W,Tang, JK,Puri, A,et al. Tribological properties of fullerenes C-60 and C-70 microparticles[J]. JOURNAL OF MATERIALS RESEARCH,1996,11(11):2749. |
APA | Zhao, W,Tang, JK,Puri, A,Sweany, RL,Li, YX,&Chen, LQ.(1996).Tribological properties of fullerenes C-60 and C-70 microparticles.JOURNAL OF MATERIALS RESEARCH,11(11),2749. |
MLA | Zhao, W,et al."Tribological properties of fullerenes C-60 and C-70 microparticles".JOURNAL OF MATERIALS RESEARCH 11.11(1996):2749. |
入库方式: OAI收割
来源:物理研究所
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