中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Two-dimensional growth of Al films on Si(111)-7 x 7 at low-temperature

文献类型:期刊论文

作者Liu, H ; Zhang, YF ; Wang, DY ; Pan, MH ; Jia, JF ; Xue, QK
刊名SURFACE SCIENCE
出版日期2004
卷号571期号:1-3页码:5
关键词BY-LAYER GROWTH SCANNING-TUNNELING-MICROSCOPY ENERGY-ELECTRON-DIFFRACTION EPITAXIAL-GROWTH HOMOEPITAXIAL GROWTH SELF-DIFFUSION AG ISLANDS SURFACES NUCLEATION AL(111)
ISSN号0039-6028
通讯作者Liu, H (reprint author), Chinese Acad Sci, State Key Lab Surface Phys, Inst Phys, ZhongGuanCun S 3rd 8,POB 603, Beijing 100080, Peoples R China.
中文摘要Morphology and structure of the AI(111) films, grown on Si(111)-7 x 7 surface at both low (145 K) and room temperature, are investigated by in situ reflection high-energy electron diffraction (RHEED) and scanning tunneling microscopy (STM). In the low-temperature case, a well-defined critical thickness of 4ML, at which atomically flat Al films with remarkable stability form, is identified. The formation of the flat film at the critical thickness completes the Al/Si(111) interface, and results in a subsequent homoepitaxial-like layer-by-layer growth for the entire Al coverages studied. The results are consistent with the formation of the quantum well states (QWS) recently observed in this system, and typify another intriguing example of quantized electronic states in tailoring thin film growth. (C) 2004 Elsevier B.V. All rights reserved.
收录类别SCI
语种英语
公开日期2013-09-23
源URL[http://ir.iphy.ac.cn/handle/311004/46257]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Liu, H,Zhang, YF,Wang, DY,et al. Two-dimensional growth of Al films on Si(111)-7 x 7 at low-temperature[J]. SURFACE SCIENCE,2004,571(1-3):5.
APA Liu, H,Zhang, YF,Wang, DY,Pan, MH,Jia, JF,&Xue, QK.(2004).Two-dimensional growth of Al films on Si(111)-7 x 7 at low-temperature.SURFACE SCIENCE,571(1-3),5.
MLA Liu, H,et al."Two-dimensional growth of Al films on Si(111)-7 x 7 at low-temperature".SURFACE SCIENCE 571.1-3(2004):5.

入库方式: OAI收割

来源:物理研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。