中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers

文献类型:期刊论文

作者Luo, GM ; Mai, ZH ; Hase, TPA ; Fulthorpe, BD ; Tanner, BK ; Marrows, CH ; Hickey, BJ
刊名JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
出版日期2001
卷号226页码:1728
关键词DIFFRACTION
ISSN号0304-8853
通讯作者Hase, TPA (reprint author), Univ Durham, Dept Phys, South Rd, Durham DH1 3LE, England.
中文摘要We report the application of reflection anomalous fine structure analysis to the study of the changes in the layer density and local environment in sputtered permalloy/copper multilayers. By fitting the smoothly varying component of the plot of multilayer Bragg peak intensity versus incident X-ray energy, we find a strained permalloy layer at the permalloy/copper but not the copper/permalloy interface. The density difference between copper and strained permalloy layers increases on annealing at 275 degreesC and from the oscillatory component of the spectrum, we show that it is the nearest-neighbour distance around the Ni atoms which decreases. (C) 2001 Elsevier Science B.V. All rights reserved.
收录类别SCI
语种英语
公开日期2013-09-23
源URL[http://ir.iphy.ac.cn/handle/311004/46709]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
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GB/T 7714
Luo, GM,Mai, ZH,Hase, TPA,et al. X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers[J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS,2001,226:1728.
APA Luo, GM.,Mai, ZH.,Hase, TPA.,Fulthorpe, BD.,Tanner, BK.,...&Hickey, BJ.(2001).X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers.JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS,226,1728.
MLA Luo, GM,et al."X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers".JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 226(2001):1728.

入库方式: OAI收割

来源:物理研究所

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