X-RAY-DIFFRACTION ANALYSIS OF SI1-XGEX/SI SUPERLATTICES
文献类型：期刊论文
| 作者 | MAI, ZH ; OUYANG, JT ; CUI, SF ; LI, JH ; WANG, CY ; LI, CR |
| 刊名 | JOURNAL OF APPLIED PHYSICS
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| 出版日期 | 1992 |
| 卷号 | 72期号:8页码:3474 |
| ISSN号 | 0021-8979 |
| 通讯作者 | MAI, ZH (reprint author), CHINESE ACAD SCI,INST PHYS,POB 603,BEIJING 10080,PEOPLES R CHINA. |
| 中文摘要 | Si1-xGex/Si strained-layer superlattices grown by molecular-beam epitaxy on Si substrates were investigated by x-ray double-crystal diffraction and x-ray grazing incidence diffraction. Both coherent and incoherent interfaces between the two components of the superlattices were observed. By fitting computer-simulated double-crystal x-ray-diffraction rocking curves to the experimental data, it is determined that there exist graded variations in both the component thickness ratio t1/t2 (t1 and t2 are the thickness of the Si1-xGex and the Si layers, respectively) and the fraction x in one sample. The x-ray grazing incidence diffraction experiments reveal a lattice strain relaxation of about 27% in another sample. The lattice relaxation and the influence of variations of x and t1/t2 on the rocking curves are discussed. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-23 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/46720]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | MAI, ZH,OUYANG, JT,CUI, SF,et al. X-RAY-DIFFRACTION ANALYSIS OF SI1-XGEX/SI SUPERLATTICES[J]. JOURNAL OF APPLIED PHYSICS,1992,72(8):3474. |
| APA | MAI, ZH,OUYANG, JT,CUI, SF,LI, JH,WANG, CY,&LI, CR.(1992).X-RAY-DIFFRACTION ANALYSIS OF SI1-XGEX/SI SUPERLATTICES.JOURNAL OF APPLIED PHYSICS,72(8),3474. |
| MLA | MAI, ZH,et al."X-RAY-DIFFRACTION ANALYSIS OF SI1-XGEX/SI SUPERLATTICES".JOURNAL OF APPLIED PHYSICS 72.8(1992):3474. |
入库方式： OAI收割
来源：物理研究所
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