Nanometre moire fringes in scanning tunnelling microscopy of surface lattices
文献类型：期刊论文
| 作者 | Guo, HM ; Liu, HW ; Wang, YL ; Gao, HJ ; Shang, HX ; Liu, ZW ; Xie, HM ; Dai, FL |
| 刊名 | NANOTECHNOLOGY
 |
| 出版日期 | 2004 |
| 卷号 | 15期号:8页码:991 |
| 关键词 | ELECTRON-BEAM MOIRE DEFORMATION MEASUREMENT GRAPHITE IMAGES MICROGRAPHS BOUNDARIES PATTERNS |
| ISSN号 | 0957-4484 |
| 通讯作者 | Gao, HJ (reprint author), Chinese Acad Sci, Inst Phys, Nanoscale Phys & Devices Lab, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | A novel class of moire fringe patterns in scanning tunnelling microscope (STM) imaging is presented and analysed in this paper. The moire fringe is generated from the interference of the atomic lattice of the specimen and STM scanning lines. Both parallel and rotational STM moire fringes of the surface of highly oriented pyrolytic graphite (HOPG) are investigated. The formation principle and experimental techniques of STM moire fringes are discussed. Nanometre scale resolution and sensitivity are found in the moire fringe patterns. They precisely magnify the STM image of lattice irregularities. A potential application-measuring surface deformation and defects in the nanometre range-is proposed. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/49674]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Guo, HM,Liu, HW,Wang, YL,et al. Nanometre moire fringes in scanning tunnelling microscopy of surface lattices[J]. NANOTECHNOLOGY,2004,15(8):991. |
| APA | Guo, HM.,Liu, HW.,Wang, YL.,Gao, HJ.,Shang, HX.,...&Dai, FL.(2004).Nanometre moire fringes in scanning tunnelling microscopy of surface lattices.NANOTECHNOLOGY,15(8),991. |
| MLA | Guo, HM,et al."Nanometre moire fringes in scanning tunnelling microscopy of surface lattices".NANOTECHNOLOGY 15.8(2004):991. |
入库方式： OAI收割
来源：物理研究所
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