Nonlinear dependence of set time on pulse voltage caused by thermal accelerated breakdown in the Ti/HfO2/Pt resistive switching devices
文献类型：期刊论文
| 作者 | Cao, MG ; Chen, YS ; Sun, JR ; Shang, DS ; Liu, LF ; Kang, JF ; Shen, BG |
| 刊名 | APPLIED PHYSICS LETTERS
 |
| 出版日期 | 2012 |
| 卷号 | 101期号:20 |
| 关键词 | RESET MECHANISM MEMORY RESISTANCE FILMS RRAM |
| ISSN号 | 0003-6951 |
| 通讯作者 | Cao, MG (reprint author), Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. |
| 中文摘要 | Dynamic processes of resistance switching have been systemically investigated for the Ti/HfO2/Pt bipolar devices. Different transient characteristics were observed in the set and reset processes. The set process consisted of a waiting step and a following abrupt transition, whereas the reset process demonstrated a gradual resistance change. Nonlinear dependence of set time on pulse voltage was observed and explained by the thermally accelerated dielectric breakdown of local switching regions. The accumulation and dissipation effects observed for different pulse treatments strongly supported the proposed model, which suggests a possible approach to overcome the voltage-time dilemma. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4766737] |
| 收录类别 | SCI |
| 资助信息 | National Basic Research of China; National Natural Science Foundation of China; Chinese Academy of Sciences; Beijing Municipal Natural Science Foundation |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/49961]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Cao, MG,Chen, YS,Sun, JR,et al. Nonlinear dependence of set time on pulse voltage caused by thermal accelerated breakdown in the Ti/HfO2/Pt resistive switching devices[J]. APPLIED PHYSICS LETTERS,2012,101(20). |
| APA | Cao, MG.,Chen, YS.,Sun, JR.,Shang, DS.,Liu, LF.,...&Shen, BG.(2012).Nonlinear dependence of set time on pulse voltage caused by thermal accelerated breakdown in the Ti/HfO2/Pt resistive switching devices.APPLIED PHYSICS LETTERS,101(20). |
| MLA | Cao, MG,et al."Nonlinear dependence of set time on pulse voltage caused by thermal accelerated breakdown in the Ti/HfO2/Pt resistive switching devices".APPLIED PHYSICS LETTERS 101.20(2012). |
入库方式： OAI收割
来源：物理研究所
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