Optical in situ monitoring of complex oxide thin film laser molecular beam epitaxy
文献类型:期刊论文
作者 | Chen, F ; Lu, HB ; Zhao, T ; Chen, ZH ; Yang, GZ |
刊名 | JOURNAL OF CRYSTAL GROWTH |
出版日期 | 2001 |
卷号 | 227页码:950 |
ISSN号 | 0022-0248 |
关键词 | POLARIZED REFLECTANCE SPECTROSCOPY GROWTH SURFACE OSCILLATIONS SRTIO3 GAAS MBE |
通讯作者 | Yang, GZ (reprint author), Chinese Acad Sci, Inst Phys, Ctr Condense Matter Phys, Lab Opt Phys, POB 603, Beijing 100080, Peoples R China. |
中文摘要 | We report the optical in situ monitoring results of the laser molecular beam epitaxial growth of complex oxide thin films using an oblique-incidence reflectance difference (OIRD) technique. The sub-monolayer sensitivity, optical interference oscillations, monolayer response observed for heteroepitaxy, and the surface kinetics study of OIRD measurement are presented. By using a four-layer stack model, the interference oscillations and the monolayer response are reproduced with Fresnel's formulas for multi-layers. (C) 2001 Elsevier Science B.V. All rights reserved. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-24 |
源URL | [http://ir.iphy.ac.cn/handle/311004/50302] |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Chen, F,Lu, HB,Zhao, T,et al. Optical in situ monitoring of complex oxide thin film laser molecular beam epitaxy[J]. JOURNAL OF CRYSTAL GROWTH,2001,227:950. |
APA | Chen, F,Lu, HB,Zhao, T,Chen, ZH,&Yang, GZ.(2001).Optical in situ monitoring of complex oxide thin film laser molecular beam epitaxy.JOURNAL OF CRYSTAL GROWTH,227,950. |
MLA | Chen, F,et al."Optical in situ monitoring of complex oxide thin film laser molecular beam epitaxy".JOURNAL OF CRYSTAL GROWTH 227(2001):950. |
入库方式: OAI收割
来源:物理研究所
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