Optical Quality Improvement of Si Photonic Devices Fabricated by Focused-Ion-Beam Milling
文献类型：期刊论文
| 作者 | Tian, J ; Yan, W ; Liu, YZ ; Luo, J ; Zhang, DZ ; Li, ZY ; Qiu, M |
| 刊名 | JOURNAL OF LIGHTWAVE TECHNOLOGY
 |
| 出版日期 | 2009 |
| 卷号 | 27期号:19页码:4306 |
| 关键词 | CRYSTAL SLABS WAVE-GUIDES MICRORING RESONATOR SILICON CHIP TRANSMISSION TECHNOLOGY NANOCAVITY FILTERS DAMAGE |
| ISSN号 | 0733-8724 |
| 通讯作者 | Tian, J (reprint author), Royal Inst Technol KTH, Dept Microelect & Appl Phys, Electrum 229, S-16440 Kista, Sweden. |
| 中文摘要 | Two types of pseudoscalar quarkonium electromagnetic decay processes, i.e. decay to a lepton pair, and to a lepton pair plus a photon (Dalitz decay), are analyzed at the leading order in NRQCD expansion. The former type of processes, highly suppressed in the Standard Model, have been hoped to act as the sensitive probes of the possible new physics. The latter type of processes generally possess much greater decay rates than the former, owing to several conspiring factors. The recently launched BES-III program, with 10(8) eta(c) samples to be anticipated in the coming years, may be able to observe the Dalitz decays eta(c) -> e(+)e(-)gamma and eta(c) -> mu(+)mu(-gamma), which have branching ratios of order 10(-6). When the radiated photon becomes very soft, the Dalitz decay events will be experimentally tagged as the exclusive lepton pair events. It is found that, those quasi-two-body events that arise from eta(c) -> e(+)e(-)gamma with photon energy less than the minimum sensitivity of the electromagnetic calorimeter, can vastly outnumber the literal eta(c) -> e(+)e(-) events, how ever this amplification is still not dramatic enough for the BES-III experiment to establish these events. Consequently, the expectation of looking for new physics signature in the eta(c) -> l(+)l(-) channel is obscured, unless the contamination from eta(c) -> l(+)l(-)gamma has been taken into account carefully. |
| 收录类别 | SCI |
| 资助信息 | Swedish Foundation for Strategic Research (SSF); SSF Strategic Research Center in Photonics; Swedish Research Council; Swedish International Development Cooperation Agency (SIDA) |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/50356]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Tian, J,Yan, W,Liu, YZ,et al. Optical Quality Improvement of Si Photonic Devices Fabricated by Focused-Ion-Beam Milling[J]. JOURNAL OF LIGHTWAVE TECHNOLOGY,2009,27(19):4306. |
| APA | Tian, J.,Yan, W.,Liu, YZ.,Luo, J.,Zhang, DZ.,...&Qiu, M.(2009).Optical Quality Improvement of Si Photonic Devices Fabricated by Focused-Ion-Beam Milling.JOURNAL OF LIGHTWAVE TECHNOLOGY,27(19),4306. |
| MLA | Tian, J,et al."Optical Quality Improvement of Si Photonic Devices Fabricated by Focused-Ion-Beam Milling".JOURNAL OF LIGHTWAVE TECHNOLOGY 27.19(2009):4306. |
入库方式： OAI收割
来源：物理研究所
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