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Origin of nanoscale potential fluctuations in two-dimensional semiconductors

文献类型:期刊论文

作者Landrock, S ; Jiang, Y ; Wu, KH ; Wang, EG ; Urban, K ; Ebert, P
刊名APPLIED PHYSICS LETTERS
出版日期2009
卷号95期号:7
关键词SURFACES DEFECTS STATES GAAS
ISSN号0003-6951
通讯作者Landrock, S (reprint author), Forschungszentrum Julich, Inst Festkorperforsch, Postfach 1913, D-52425 Julich, Germany.
中文摘要We demonstrate a direct atomically resolved visualization and quantification of the impact of inhomogeneities in the dopant distribution on the nanoscale potential fluctuations in a two-dimensional semiconducting root 3 x root 3 Ga overlayer on Si(111) using scanning tunneling microscopy. By a quantitative analysis, two regimes of the potential at nanometer scale are found, which arise from the local distribution of charge carriers in the bands and from electron-electron interactions. (C) 2009 American Institute of Physics. [DOI:10.1063/1.3177329]
收录类别SCI
资助信息Deutsche Forschungsgemeinschaft; GIF
语种英语
公开日期2013-09-24
源URL[http://ir.iphy.ac.cn/handle/311004/50476]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Landrock, S,Jiang, Y,Wu, KH,et al. Origin of nanoscale potential fluctuations in two-dimensional semiconductors[J]. APPLIED PHYSICS LETTERS,2009,95(7).
APA Landrock, S,Jiang, Y,Wu, KH,Wang, EG,Urban, K,&Ebert, P.(2009).Origin of nanoscale potential fluctuations in two-dimensional semiconductors.APPLIED PHYSICS LETTERS,95(7).
MLA Landrock, S,et al."Origin of nanoscale potential fluctuations in two-dimensional semiconductors".APPLIED PHYSICS LETTERS 95.7(2009).

入库方式: OAI收割

来源:物理研究所

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