Phase shifting nano-moire method with scanning tunneling microscope
文献类型：期刊论文
| 作者 | Shang, HX ; Xie, HM ; Liu, ZW ; Guo, HM ; Gao, HJ ; Dai, FL |
| 刊名 | OPTICS AND LASERS IN ENGINEERING
 |
| 出版日期 | 2004 |
| 卷号 | 41期号:5页码:755 |
| 关键词 | ATOMIC-FORCE MICROSCOPE DEFORMATION MEASUREMENT |
| ISSN号 | 0143-8166 |
| 通讯作者 | Shang, HX (reprint author), Tsing Hua Univ, Dept Engn Mech, Beijing 100084, Peoples R China. |
| 中文摘要 | In this paper, a new nano-moire method using scanning tunneling microscope (STM) is proposed. This method is capable of measuring nanoscopic deformation of matter. The formation mechanism of the STM moire fringe and the phase shifting technique used in STM moire fringes are explained in details. Typical experiments are conducted with the crystal lattices of freshly cleaved highly oriented pyrolytic graphite, are used as specimen grating, to generate STM moire fringe patterns. Phase shifting is realized in four steps from 0 to 2pi by controlling the PZT in the STM system to shift the specimen in the vertical direction. This method provides a new way for disposal of moire fringes pattern in the nano-moire measurement. (C) 2003 Elsevier Science Ltd. All rights reserved. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/50805]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Shang, HX,Xie, HM,Liu, ZW,et al. Phase shifting nano-moire method with scanning tunneling microscope[J]. OPTICS AND LASERS IN ENGINEERING,2004,41(5):755. |
| APA | Shang, HX,Xie, HM,Liu, ZW,Guo, HM,Gao, HJ,&Dai, FL.(2004).Phase shifting nano-moire method with scanning tunneling microscope.OPTICS AND LASERS IN ENGINEERING,41(5),755. |
| MLA | Shang, HX,et al."Phase shifting nano-moire method with scanning tunneling microscope".OPTICS AND LASERS IN ENGINEERING 41.5(2004):755. |
入库方式： OAI收割
来源：物理研究所
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