Polarity determination of ZnO thin films by electron holography
文献类型：期刊论文
| 作者 | Xu, QY ; Wang, Y ; Du, XL ; Du, XL ; Xue, QK ; Zhang, Z |
| 刊名 | APPLIED PHYSICS LETTERS
 |
| 出版日期 | 2004 |
| 卷号 | 84期号:12页码:2067 |
| 关键词 | GAN SPECTROSCOPY POLARIZATION SURFACE GROWTH |
| ISSN号 | 0003-6951 |
| 通讯作者 | Xu, QY (reprint author), Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | The polarity of the ZnO film grown on sapphire using an ultrathin Ga wetting layer has been investigated by electron holography. Spontaneous polarization of the ZnO film leads to localized charges in the surface, which change the potential distribution in the vacuum side of the film. The potential distribution depends on the nature of the bounded charges and change as a function of the distance from the film surface. By studying the dependence of the potential change on the distance from the film surface, the ZnO film with very thin Ga wetting layer is determined to have the [0001] polarity. (C) 2004 American Institute of Physics. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/51090]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Xu, QY,Wang, Y,Du, XL,et al. Polarity determination of ZnO thin films by electron holography[J]. APPLIED PHYSICS LETTERS,2004,84(12):2067. |
| APA | Xu, QY,Wang, Y,Du, XL,Du, XL,Xue, QK,&Zhang, Z.(2004).Polarity determination of ZnO thin films by electron holography.APPLIED PHYSICS LETTERS,84(12),2067. |
| MLA | Xu, QY,et al."Polarity determination of ZnO thin films by electron holography".APPLIED PHYSICS LETTERS 84.12(2004):2067. |
入库方式： OAI收割
来源：物理研究所
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