Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation
文献类型:期刊论文
作者 | Zhang, J ; Sugioka, K ; Wada, S ; Tashiro, H ; Toyoda, K ; Midorikawa, K |
刊名 | APPLIED SURFACE SCIENCE
![]() |
出版日期 | 1998 |
卷号 | 127页码:793 |
ISSN号 | 0169-4332 |
通讯作者 | Zhang, J (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
中文摘要 | An X-ray reflectivity (XR) study of the dynamic evolution of the film surface was carried out for molybdenum (Mo) sputter-deposited onto silicon substrates. The Mo-air interface width grows with time, and exhibits a power law behavior. The growth exponent beta is found to be 0.42. The time-invariant self-affine behavior an the short-range scale has also been observed, and is consistent with the dynamic scaling theory. The roughness exponent alpha is found to be 0.89 +/- 0.05. Scanning tunneling microscopy (STM) was also used to characterize the surface and showed good agreement with the XR measurements. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-24 |
源URL | [http://ir.iphy.ac.cn/handle/311004/51219] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Zhang, J,Sugioka, K,Wada, S,et al. Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation[J]. APPLIED SURFACE SCIENCE,1998,127:793. |
APA | Zhang, J,Sugioka, K,Wada, S,Tashiro, H,Toyoda, K,&Midorikawa, K.(1998).Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation.APPLIED SURFACE SCIENCE,127,793. |
MLA | Zhang, J,et al."Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation".APPLIED SURFACE SCIENCE 127(1998):793. |
入库方式: OAI收割
来源:物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。