中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation

文献类型:期刊论文

作者Zhang, J ; Sugioka, K ; Wada, S ; Tashiro, H ; Toyoda, K ; Midorikawa, K
刊名APPLIED SURFACE SCIENCE
出版日期1998
卷号127页码:793
ISSN号0169-4332
通讯作者Zhang, J (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要An X-ray reflectivity (XR) study of the dynamic evolution of the film surface was carried out for molybdenum (Mo) sputter-deposited onto silicon substrates. The Mo-air interface width grows with time, and exhibits a power law behavior. The growth exponent beta is found to be 0.42. The time-invariant self-affine behavior an the short-range scale has also been observed, and is consistent with the dynamic scaling theory. The roughness exponent alpha is found to be 0.89 +/- 0.05. Scanning tunneling microscopy (STM) was also used to characterize the surface and showed good agreement with the XR measurements.
收录类别SCI
语种英语
公开日期2013-09-24
源URL[http://ir.iphy.ac.cn/handle/311004/51219]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Zhang, J,Sugioka, K,Wada, S,et al. Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation[J]. APPLIED SURFACE SCIENCE,1998,127:793.
APA Zhang, J,Sugioka, K,Wada, S,Tashiro, H,Toyoda, K,&Midorikawa, K.(1998).Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation.APPLIED SURFACE SCIENCE,127,793.
MLA Zhang, J,et al."Precise microfabrication of wide band gap semiconductors (SiC and GaN) by VUV-UV multiwavelength laser ablation".APPLIED SURFACE SCIENCE 127(1998):793.

入库方式: OAI收割

来源:物理研究所

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