中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Processing of an atomically smooth Ge(001) surface on a large scale

文献类型:期刊论文

作者Qin, ZH ; Shi, DX ; Ji, W ; Pan, SJ ; Gao, HJ
刊名NANOTECHNOLOGY
出版日期2006
卷号17期号:9页码:2396
关键词SCANNING-TUNNELING-MICROSCOPY GE CLUSTERS DEFECTS RECONSTRUCTION SI(100)-2X1 SI(001) AG
ISSN号0957-4484
通讯作者Gao, HJ (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要An atomically smooth Ge(001) surface on a large scale is obtained by deposition of submonolayer Ge on a Ge( 001) surface at 300 degrees C, which repairs the missing dimer defects produced during the enhanced energy ion bombardment and annealing of the substrate. The Ge( 001) samples are characterized by scanning tunnelling microscopy (STM) before and after the submonolayer Ge deposition. The ion bombardment/subsequent annealing processing and STM tip induced defects are also investigated in detail.
收录类别SCI
语种英语
公开日期2013-09-24
源URL[http://ir.iphy.ac.cn/handle/311004/51483]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Qin, ZH,Shi, DX,Ji, W,et al. Processing of an atomically smooth Ge(001) surface on a large scale[J]. NANOTECHNOLOGY,2006,17(9):2396.
APA Qin, ZH,Shi, DX,Ji, W,Pan, SJ,&Gao, HJ.(2006).Processing of an atomically smooth Ge(001) surface on a large scale.NANOTECHNOLOGY,17(9),2396.
MLA Qin, ZH,et al."Processing of an atomically smooth Ge(001) surface on a large scale".NANOTECHNOLOGY 17.9(2006):2396.

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来源:物理研究所

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