Restoring atomic configuration at interfaces by image deconvolution
文献类型：期刊论文
| 作者 | Tang, CY ; Li, FH |
| 刊名 | JOURNAL OF ELECTRON MICROSCOPY
 |
| 出版日期 | 2005 |
| 卷号 | 54期号:5页码:445 |
| 关键词 | RESOLUTION ELECTRON-MICROSCOPY EXIT-WAVE RECONSTRUCTION 0.1 NM RESOLUTION FOCUS-VARIATION GRAIN-BOUNDARY DISLOCATION DIFFRACTION CRYSTALS HREM HOLOGRAPHY |
| ISSN号 | 0022-0744 |
| 通讯作者 | Li, FH (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | The image deconvolution technique in combination with dynamical scattering effect correction developed previously for crystal defect investigation has been modified to meet the needs of interface studies and applied to a {111} twin model of Si. Elliptical windows are utilized as a new means for Fourier filtering and correcting the amplitudes of reflections. Images were simulated with a 200 kV field-emission high-resolution electron microscope. After image restoration, four images simulated with different defocus values were transformed into structure images with atomic columns revealed individually at correct positions. The effectiveness of the technique is discussed. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/52154]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Tang, CY,Li, FH. Restoring atomic configuration at interfaces by image deconvolution[J]. JOURNAL OF ELECTRON MICROSCOPY,2005,54(5):445. |
| APA | Tang, CY,&Li, FH.(2005).Restoring atomic configuration at interfaces by image deconvolution.JOURNAL OF ELECTRON MICROSCOPY,54(5),445. |
| MLA | Tang, CY,et al."Restoring atomic configuration at interfaces by image deconvolution".JOURNAL OF ELECTRON MICROSCOPY 54.5(2005):445. |
入库方式： OAI收割
来源：物理研究所
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