Rietveld X-ray spectrum analysis for Tb(0.27)Dy0.73Fe(2-x)Si(x)
文献类型：期刊论文
| 作者 | Wu, L ; Zhan, WS ; Chen, XC |
| 刊名 | JOURNAL OF ALLOYS AND COMPOUNDS
 |
| 出版日期 | 1997 |
| 卷号 | 255期号:1-2页码:236 |
| 关键词 | REFINEMENTS |
| ISSN号 | 0925-8388 |
| 通讯作者 | Wu, L (reprint author), TSING HUA UNIV,DEPT MODERN APPL PHYS,ACOUST LAB,BEIJING 100084,PEOPLES R CHINA. |
| 中文摘要 | The crystal structures of Tb0.27Dy0.73Fe2-xSix were refined by the Rietveld analysis of their X-ray powder diffraction patterns. With the increase of Si, the lattice constant decreases. The Si only replace Fe at 16c position. When x < 0.2, the alloys consist of only one phase. The concentration dependence of magnetostriction and Curie temperature of Tb0.27Dy0.73Fe2-xSix samples has been investigated. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/52190]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Wu, L,Zhan, WS,Chen, XC. Rietveld X-ray spectrum analysis for Tb(0.27)Dy0.73Fe(2-x)Si(x)[J]. JOURNAL OF ALLOYS AND COMPOUNDS,1997,255(1-2):236. |
| APA | Wu, L,Zhan, WS,&Chen, XC.(1997).Rietveld X-ray spectrum analysis for Tb(0.27)Dy0.73Fe(2-x)Si(x).JOURNAL OF ALLOYS AND COMPOUNDS,255(1-2),236. |
| MLA | Wu, L,et al."Rietveld X-ray spectrum analysis for Tb(0.27)Dy0.73Fe(2-x)Si(x)".JOURNAL OF ALLOYS AND COMPOUNDS 255.1-2(1997):236. |
入库方式： OAI收割
来源：物理研究所
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