中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Room-temperature growth of al films on Si(111)-7x7 surface

文献类型:期刊论文

作者Liu, H ; Zhang, YF ; Wang, DY ; Jia, JF ; Xue, QK
刊名CHINESE PHYSICS LETTERS
出版日期2004
卷号21期号:8页码:1608
关键词IONIZED-CLUSTER BEAM EPITAXIAL-GROWTH HETEROEPITAXY DEPOSITION ALUMINUM SILICON
ISSN号0256-307X
通讯作者Liu, H (reprint author), Chinese Acad Sci, Inst Phys, State Key Lab Surface Phys, POB 603, Beijing 100080, Peoples R China.
中文摘要Reflection high energy electron diffraction and scanning tunnelling microscopy (STM) are used to investigate the structure and morphology of Al films deposited on Si(111)-7 x 7 surface at room temperature. The films are polycrystalline, made up of (100) and (111) oriented islands, which primarily result from the interface elastic effect and free surface energies of the Al (100) and (111) surfaces.
收录类别SCI
语种英语
公开日期2013-09-24
源URL[http://ir.iphy.ac.cn/handle/311004/52258]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Liu, H,Zhang, YF,Wang, DY,et al. Room-temperature growth of al films on Si(111)-7x7 surface[J]. CHINESE PHYSICS LETTERS,2004,21(8):1608.
APA Liu, H,Zhang, YF,Wang, DY,Jia, JF,&Xue, QK.(2004).Room-temperature growth of al films on Si(111)-7x7 surface.CHINESE PHYSICS LETTERS,21(8),1608.
MLA Liu, H,et al."Room-temperature growth of al films on Si(111)-7x7 surface".CHINESE PHYSICS LETTERS 21.8(2004):1608.

入库方式: OAI收割

来源:物理研究所

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