中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Roughening and islanding of monolayer Ge coverage on vicinal Si(001) surface

文献类型:期刊论文

作者Guo, LW ; Lin, N ; Huang, Q ; Zhou, JM ; Cue, N
刊名APPLIED SURFACE SCIENCE
出版日期1998
卷号126期号:3-4页码:213
关键词STRAIN GROWTH LAYER SI(100) MORPHOLOGY EPITAXY STRESS
ISSN号0169-4332
通讯作者Guo, LW (reprint author), Hong Kong Univ Sci & Technol, Dept Phys, Hong Kong, Peoples R China.
中文摘要Roughening and islanding of monolayer Ce coverage on vicinal Si(001) surface has been studied using scanning tunneling microscope (STM). For a 3.9 degrees miscut surface, planar buckled-dimer surface is a metastable state limited by a barrier, which can be overcome by a 680 degrees C annealing. After the annealing, the metastable flat surface has been changed to a rough surface of small hills because of step-bunching, and on top of each hill, a 3 dimensional (3D) nanoscale island was observed. The mechanism of this roughening and islanding process have been discussed. (C) 1998 Elsevier Science B.V.
收录类别SCI
语种英语
公开日期2013-09-24
源URL[http://ir.iphy.ac.cn/handle/311004/52271]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Guo, LW,Lin, N,Huang, Q,et al. Roughening and islanding of monolayer Ge coverage on vicinal Si(001) surface[J]. APPLIED SURFACE SCIENCE,1998,126(3-4):213.
APA Guo, LW,Lin, N,Huang, Q,Zhou, JM,&Cue, N.(1998).Roughening and islanding of monolayer Ge coverage on vicinal Si(001) surface.APPLIED SURFACE SCIENCE,126(3-4),213.
MLA Guo, LW,et al."Roughening and islanding of monolayer Ge coverage on vicinal Si(001) surface".APPLIED SURFACE SCIENCE 126.3-4(1998):213.

入库方式: OAI收割

来源:物理研究所

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