Roughness with a finite correlation length in a microtrap
文献类型：期刊论文
| 作者 | Wu, MZ ; Zhou, XJ ; liu, WM ; Chen, XZ |
| 刊名 | PHYSICAL REVIEW A
 |
| 出版日期 | 2010 |
| 卷号 | 81期号:3 |
| 关键词 | BOSE-EINSTEIN CONDENSATION ATOM CHIPS SURFACE WIRES |
| ISSN号 | 1050-2947 |
| 通讯作者 | Wu, MZ (reprint author), Peking Univ, Sch Elect Engn & Comp Sci, Beijing 100871, Peoples R China. |
| 中文摘要 | We analyze the effects of roughness in the magnitude of the magnetic field produced by a current carrying microwire, which is caused by the geometric fluctuation of the edge of the wire. The relation between the fluctuation of the trapping potential and the height the atom trap lies above the wire is very well consistent with the experimental data when the colored noise with a finite correlation length is considered. On this basis, we generate the random potential and get the density distribution of the Bose-Einstein condensate (BEC) atoms by solving the Gross-Pitaevskii equation, which coincides well with the experimental image, especially in the number of fragmentations. The results help us further understand the nature of the fluctuation and predict its possible application in the precise measurement. |
| 收录类别 | SCI |
| 资助信息 | state Key Development Program for Basic Research of China [2005CB724503, 2006CB921401, 2006CB921402]; NSFC [10874008, 10934010] |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/52272]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Wu, MZ,Zhou, XJ,liu, WM,et al. Roughness with a finite correlation length in a microtrap[J]. PHYSICAL REVIEW A,2010,81(3). |
| APA | Wu, MZ,Zhou, XJ,liu, WM,&Chen, XZ.(2010).Roughness with a finite correlation length in a microtrap.PHYSICAL REVIEW A,81(3). |
| MLA | Wu, MZ,et al."Roughness with a finite correlation length in a microtrap".PHYSICAL REVIEW A 81.3(2010). |
入库方式： OAI收割
来源：物理研究所
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