Scanning Auger electron spectroscopic investigations of magnetostrictive nanoscale multilayers
文献类型：期刊论文
| 作者 | Nold, E ; Adelhelm, C ; Ludwig, A ; Shen, DH |
| 刊名 | CHINESE PHYSICS
 |
| 出版日期 | 2001 |
| 卷号 | 10页码:S45 |
| 关键词 | SYSTEMS |
| ISSN号 | 1009-1963 |
| 通讯作者 | Nold, E (reprint author), Forschungszentrum Karlsruhe, Inst Mat Forsch, Postfach 3640, D-76021 Karlsruhe, Germany. |
| 中文摘要 | The characterisation of thin magnetostrictive multilayers in the nanometerscale range [(4,5nmTb(40)Fe(60)/9nmFe)x100] demands a surface sensitive analytical technique. A suitable technique is scanning Auger Electron Spectroscopy (AES) to determine the elemental composition, the thickness, the presence of interdiffusion between thin layers, or the presence of contamination at interfaces. Auger sputter depth profiles are obtained by using Xe-Ion bombardment to etch the sample. Sample rotation during sputtering produces shallow craters, minimises roughening and enhances depth resolution. In addition, Auger maps of the craters are used to reveal the separated magnetostrictive Tb40Fe60 layers and soft magnetic Fe layers. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/52322]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Nold, E,Adelhelm, C,Ludwig, A,et al. Scanning Auger electron spectroscopic investigations of magnetostrictive nanoscale multilayers[J]. CHINESE PHYSICS,2001,10:S45. |
| APA | Nold, E,Adelhelm, C,Ludwig, A,&Shen, DH.(2001).Scanning Auger electron spectroscopic investigations of magnetostrictive nanoscale multilayers.CHINESE PHYSICS,10,S45. |
| MLA | Nold, E,et al."Scanning Auger electron spectroscopic investigations of magnetostrictive nanoscale multilayers".CHINESE PHYSICS 10(2001):S45. |
入库方式： OAI收割
来源：物理研究所
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