中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Scanning tunneling microscopy of interface properties of Bi2Se3 on FeSe

文献类型:期刊论文

作者Wang, YL ; Jiang, YP ; Chen, M ; Li, Z ; Song, CL ; Wang, LL ; He, K ; Chen, X ; Ma, XC ; Xue, QK
刊名JOURNAL OF PHYSICS-CONDENSED MATTER
出版日期2012
卷号24期号:47
关键词DER-WAALS EPITAXY VANDERWAALS EPITAXY MOIRE PATTERN NOBEL LECTURE THIN-FILMS GRAPHENE GROWTH IMAGES SUPERCONDUCTIVITY SURFACE
ISSN号0953-8984
通讯作者Wang, YL (reprint author), Chinese Acad Sci, Inst Phys, State Key Lab Surface Phys, Beijing 100190, Peoples R China.
中文摘要We investigate the heteroepitaxial growth of Bi2Se3 films on FeSe substrates by low-temperature scanning tunneling microscopy/spectroscopy. The growth of Bi2Se3 on FeSe proceeds via van der Waals epitaxy with atomically flat morphology. A striped moire pattern originating from the lattice mismatch between Bi2Se3 and FeSe is observed. Tunneling spectra reveal the spatially inhomogeneous electronic structure of the Bi2Se3 thin films, which can be ascribed to the charge transfer at the interface.
收录类别SCI
资助信息National Natural Science Foundation of China; Ministry of Science and Technology of China; Chinese Academy of Sciences
语种英语
公开日期2013-09-24
源URL[http://ir.iphy.ac.cn/handle/311004/52332]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Wang, YL,Jiang, YP,Chen, M,et al. Scanning tunneling microscopy of interface properties of Bi2Se3 on FeSe[J]. JOURNAL OF PHYSICS-CONDENSED MATTER,2012,24(47).
APA Wang, YL.,Jiang, YP.,Chen, M.,Li, Z.,Song, CL.,...&Xue, QK.(2012).Scanning tunneling microscopy of interface properties of Bi2Se3 on FeSe.JOURNAL OF PHYSICS-CONDENSED MATTER,24(47).
MLA Wang, YL,et al."Scanning tunneling microscopy of interface properties of Bi2Se3 on FeSe".JOURNAL OF PHYSICS-CONDENSED MATTER 24.47(2012).

入库方式: OAI收割

来源:物理研究所

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