Size effects of the critical temperature in ferroelectric thin films
文献类型：期刊论文
| 作者 | Hu, ZN ; Lo, VC |
| 刊名 | COMMUNICATIONS IN THEORETICAL PHYSICS
 |
| 出版日期 | 2007 |
| 卷号 | 48期号:1页码:183 |
| ISSN号 | 0253-6102 |
| 中文摘要 | The size effects of the critical behaviors for the systems of interacting spins are discussed extensively in literature. In this paper, the linite-size dependence of the critical temperature and susceptibility of the ferroelectric thin him are investigated numerically based on the four-state Potts model with the nearest-neighbor interactions between the dipole moments. The four orientations of the domains exist in the ferroelectric film and the movement of the domain walls determines the polarization switching process besides the boundary conditions of the film. The critical exponents are obtained and our investigations show that the boundary conditions play the important roles for the ferroelectric properties of the thin films and the critical behavior of the thin films strongly depends on the feature of the surface. |
| 收录类别 | SCI |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/52677]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Hu, ZN,Lo, VC. Size effects of the critical temperature in ferroelectric thin films[J]. COMMUNICATIONS IN THEORETICAL PHYSICS,2007,48(1):183. |
| APA | Hu, ZN,&Lo, VC.(2007).Size effects of the critical temperature in ferroelectric thin films.COMMUNICATIONS IN THEORETICAL PHYSICS,48(1),183. |
| MLA | Hu, ZN,et al."Size effects of the critical temperature in ferroelectric thin films".COMMUNICATIONS IN THEORETICAL PHYSICS 48.1(2007):183. |
入库方式： OAI收割
来源：物理研究所
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