Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas
文献类型：期刊论文
| 作者 | Liang, GY ; Zhao, G ; Zhong, JY ; Li, YT ; Liu, YQ ; Dong, QL ; Yuan, XH ; Jin, Z ; Zhang, J |
| 刊名 | ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES
 |
| 出版日期 | 2008 |
| 卷号 | 177期号:1页码:326 |
| 关键词 | TRANSMISSION GRATING SPECTROMETER EMISSION-LINE SPECTRA XMM-NEWTON LIGHT MEASUREMENTS RATE COEFFICIENTS CAPELLA CHANDRA DIAGNOSTICS PROCYON REGION |
| ISSN号 | 0067-0049 |
| 通讯作者 | Liang, GY (reprint author), Chinese Acad Sci, Natl Astron Observ, A20 Datun Rd,Chaoyang Dist, Beijing 100012, Peoples R China. |
| 中文摘要 | Rich soft X-ray emission lines of highly charged silicon ions (Si vi-Si XII) were observed by irradiating an ultraintense laser pulse with width of 200 fs and energy of similar to 90 mJ on the solid silicon target. The high-resolution spectra of highly charged silicon ions with full width at half-maximum (FWHM) of similar to 0.3Y0.4 angstrom is analyzed in the wavelength range of 40-90 angstrom. The wavelengths of 53 prominent lines are determined with statistical uncertainties of up to 0.005 angstrom. Collisional-radiative models were constructed for Si VI-Si XII ions, which satisfactorily reproduce the experimental spectra and help in the line identification. Calculations at different electron densities reveal that the spectra of dense plasmas are more complicated than the spectra of thin plasmas. A comparison with the Kelly database reveals a good agreement for most peak intensities and differences for a few emission lines. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/52725]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Liang, GY,Zhao, G,Zhong, JY,et al. Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas[J]. ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES,2008,177(1):326. |
| APA | Liang, GY.,Zhao, G.,Zhong, JY.,Li, YT.,Liu, YQ.,...&Zhang, J.(2008).Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas.ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES,177(1),326. |
| MLA | Liang, GY,et al."Soft X-ray spectroscopy of highly charged silicon ions in dense plasmas".ASTROPHYSICAL JOURNAL SUPPLEMENT SERIES 177.1(2008):326. |
入库方式： OAI收割
来源：物理研究所
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