Structure properties of BiFeO(3) films studied by micro-Raman scattering
文献类型：期刊论文
| 作者 | Yang, Y ; Sun, JY ; Zhu, K ; Liu, YL ; Wan, L |
| 刊名 | JOURNAL OF APPLIED PHYSICS
 |
| 出版日期 | 2008 |
| 卷号 | 103期号:9 |
| 关键词 | THIN-FILMS PHASE-TRANSITION CRYSTAL |
| ISSN号 | 0021-8979 |
| 通讯作者 | Liu, YL (reprint author), Chinese Acad Sci, Inst Phys, POB 603, Beijing 100080, Peoples R China. |
| 中文摘要 | BiFeO(3) (BFO) films deposited on SrTiO(3) (001) substrates and on LaNiO(3)-coated SrTiO(3) (001) substrates with different annealing ambiences of oxygen and nitrogen were studied by using micro-Raman spectroscopy and x-ray diffraction (XRD). XRD showed that the films are in single-phase with rhombohedral structure. According to the analysis of the group theory, 13 Raman-active modes, which can be classified as 4A(1) and 9E modes, have been observed in the BiFeO(3) films. Raman spectra along the growth direction of the BFO films in the side-view scattering geometry were performed by the Raman mapping technique. The variations of Raman shift and Raman bandwidth in different depths of the films imply the existence of residual strain along the growth direction of the BFO films. These results are very useful for the understanding of the depth dependence of the physical properties including the interface and surface structure of the BFO films. (C) 2008 American Institute of Physics. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2013-09-24 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/53604]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Yang, Y,Sun, JY,Zhu, K,et al. Structure properties of BiFeO(3) films studied by micro-Raman scattering[J]. JOURNAL OF APPLIED PHYSICS,2008,103(9). |
| APA | Yang, Y,Sun, JY,Zhu, K,Liu, YL,&Wan, L.(2008).Structure properties of BiFeO(3) films studied by micro-Raman scattering.JOURNAL OF APPLIED PHYSICS,103(9). |
| MLA | Yang, Y,et al."Structure properties of BiFeO(3) films studied by micro-Raman scattering".JOURNAL OF APPLIED PHYSICS 103.9(2008). |
入库方式： OAI收割
来源：物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。