Study of structures and dielectric dispersion behavior of BaTiO3/YBa2Cu3O7-x bilayer films
文献类型:期刊论文
作者 | Zhu, AJ ; Li, CL ; Ma, K ; Wang, ZM ; Xiong, XM ; Wu, W ; Wang, CY ; Wu, LS ; Li, JH ; Li, L ; Chen, HG ; Mai, ZH |
刊名 | PHYSICA C
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出版日期 | 1997 |
卷号 | 282页码:705 |
ISSN号 | 0921-4534 |
通讯作者 | Zhu, AJ (reprint author), CHINESE ACAD SCI,INST PHYS,POB 603,BEIJING 100080,PEOPLES R CHINA. |
中文摘要 | The structures of BaTiO3/YBa2Cu3O7-z bilayer films and their low frequency dielectric dispersion behavior were investigated. With the increase of BaTiO3 film thickness, the crystallinity of the BaTiO3 films gets better and the c-axis lattice constants become smaller. It is shown that the ion-vacancy migration, related to film structures, film defects and boundaries, plays an important role in the low frequency dielectric dispersion behavior. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-24 |
源URL | [http://ir.iphy.ac.cn/handle/311004/53786] ![]() |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Zhu, AJ,Li, CL,Ma, K,et al. Study of structures and dielectric dispersion behavior of BaTiO3/YBa2Cu3O7-x bilayer films[J]. PHYSICA C,1997,282:705. |
APA | Zhu, AJ.,Li, CL.,Ma, K.,Wang, ZM.,Xiong, XM.,...&Mai, ZH.(1997).Study of structures and dielectric dispersion behavior of BaTiO3/YBa2Cu3O7-x bilayer films.PHYSICA C,282,705. |
MLA | Zhu, AJ,et al."Study of structures and dielectric dispersion behavior of BaTiO3/YBa2Cu3O7-x bilayer films".PHYSICA C 282(1997):705. |
入库方式: OAI收割
来源:物理研究所
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