中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Superconductivity, Hall properties and disorder effect in Pr1-xCaxBa2Cu3O7-delta (0.4 <= x <= 0.6) epitaxial thin films

文献类型:期刊论文

作者Li, SL ; Li, J ; Xiang, JY ; Chu, HF ; Li, S ; Wang, P ; Zheng, DN
刊名SUPERCONDUCTOR SCIENCE & TECHNOLOGY
出版日期2008
卷号21期号:3
ISSN号0953-2048
中文摘要Superconducting Pr1-xCaxBa2Cu3O7-delta (PCBCO) thin films with high Ca concentration (0.4 <= x <= 0.6) have been prepared. As characterized by x-ray diffraction, good quality c-axis and a-axis oriented epitaxial thin films are grown on SrTiO3 substrates by changing the substrate temperature. However, for each Ca concentration, higher zero resistance temperature (T-C0) is generally observed in samples with mixed orientations grown at moderate temperatures. The best T-C0 are 26.5 K, 34.1 K and 16.8 K for x = 0.4, 0.5 and 0.6 samples, respectively. Hall measurements reveal that the hole mobility decreases as x increases, while the Hall number n(H) reaches a maximum as x approaches 0.5, then reduces dramatically. It appears that the T-2 dependence of cot theta(H) is still feasible in this system, and the effect of Ca substitution on transport properties in PCBCO is a result of the competition between carrier introduction and carrier localization.
收录类别SCI
公开日期2013-09-24
源URL[http://ir.iphy.ac.cn/handle/311004/54095]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Li, SL,Li, J,Xiang, JY,et al. Superconductivity, Hall properties and disorder effect in Pr1-xCaxBa2Cu3O7-delta (0.4 <= x <= 0.6) epitaxial thin films[J]. SUPERCONDUCTOR SCIENCE & TECHNOLOGY,2008,21(3).
APA Li, SL.,Li, J.,Xiang, JY.,Chu, HF.,Li, S.,...&Zheng, DN.(2008).Superconductivity, Hall properties and disorder effect in Pr1-xCaxBa2Cu3O7-delta (0.4 <= x <= 0.6) epitaxial thin films.SUPERCONDUCTOR SCIENCE & TECHNOLOGY,21(3).
MLA Li, SL,et al."Superconductivity, Hall properties and disorder effect in Pr1-xCaxBa2Cu3O7-delta (0.4 <= x <= 0.6) epitaxial thin films".SUPERCONDUCTOR SCIENCE & TECHNOLOGY 21.3(2008).

入库方式: OAI收割

来源:物理研究所

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