Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors
文献类型：期刊论文
| 作者 | Hou, YN ; Mei, ZX ; Liang, HL ; Ye, DQ ; Gu, CZ ; Du, XL ; Lu, YC |
| 刊名 | IEEE TRANSACTIONS ON ELECTRON DEVICES
 |
| 出版日期 | 2013 |
| 卷号 | 60期号:10页码:3474 |
| 关键词 | MgZnO metal-semiconductor contact persistent photocurrent (PPC) ultraviolet photodetector |
| ISSN号 | 0018-9383 |
| 通讯作者 | Hou, YN (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. |
| 中文摘要 | Effects of postannealing on Ti/Au-MgZnO contact and n-MgZnO/p-Si heterojunction ultraviolet-B photodetector's performance are investigated. It is found that the out diffusion of oxygen from MgZnO and its bonding with Ti at the interface have significant influences on the properties of Ti/MgZnO interface and photodetector. The persistent photocurrent observed in the annealed device is attributed to the oxygen vacancies near the interface, consistent with the theoretical calculations. It is revealed that the reaction at metal/MgZnO interface possibly plays a key role and even dominates the MgZnO p-n heterojunction ultraviolet detectors' performances. |
| 资助信息 | Ministry of Science and Technology of China [2011CB302002, 2011CB302006, 2009CB929404]; National Science Foundation [61076007, 11174348, 51272280, 11274366, 61204067]; Chinese Academy of Sciences |
| 语种 | 英语 |
| 公开日期 | 2014-01-16 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/56777]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Hou, YN,Mei, ZX,Liang, HL,et al. Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES,2013,60(10):3474. |
| APA | Hou, YN.,Mei, ZX.,Liang, HL.,Ye, DQ.,Gu, CZ.,...&Lu, YC.(2013).Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors.IEEE TRANSACTIONS ON ELECTRON DEVICES,60(10),3474. |
| MLA | Hou, YN,et al."Annealing Effects of Ti/Au Contact on n-MgZnO/p-Si Ultraviolet-B Photodetectors".IEEE TRANSACTIONS ON ELECTRON DEVICES 60.10(2013):3474. |
入库方式： OAI收割
来源：物理研究所
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