中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of inhomogeneity and plasmons on terahertz radiation from GaAs (100) surface coated with rough Au film

文献类型:期刊论文

作者Wu, XJ ; Quan, BG ; Xu, XL ; Hu, FR ; Lu, XC ; Gu, CZ ; Wang, L
刊名APPLIED SURFACE SCIENCE
出版日期2013
卷号285页码:853
关键词Semiconductor surface THz radiation Surface plasmon
ISSN号0169-4332
通讯作者Xu, XL (reprint author), NW Univ Xian, Nanobiophoton Ctr, State Key Lab Incubat Base Photoelect Technol & F, Xian 710069, Peoples R China.
中文摘要We measured terahertz (THz) radiation from GaAs (1 0 0) surface coated with rough Au film in the thickness ranging from 5 to 21nm under the incident angle from 0 to 50. Anomalous THz emission was observed with inhomogeneous crack structures at normal incidence, which originates dominantly from the lateral photo-Dember current. Meanwhile, enhanced THz radiation from Au/GaAs was investigated with the variation of the Au morphology, which confirmed that localized surface plasmons play an important role in the THz radiation. The results indicate the prospect of harnessing surface plasmons for efficient THz emission with controllable morphology of Au on semiconductors. (C) 2013 Elsevier B.V. All rights reserved.
资助信息National Natural Science Foundation of China [11374240, 11374358, 61255005]; Natural Science Basic Research Plan of Shaanxi Province, China [2012KJXX-27]
语种英语
公开日期2014-01-16
源URL[http://ir.iphy.ac.cn/handle/311004/56916]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Wu, XJ,Quan, BG,Xu, XL,et al. Effect of inhomogeneity and plasmons on terahertz radiation from GaAs (100) surface coated with rough Au film[J]. APPLIED SURFACE SCIENCE,2013,285:853.
APA Wu, XJ.,Quan, BG.,Xu, XL.,Hu, FR.,Lu, XC.,...&Wang, L.(2013).Effect of inhomogeneity and plasmons on terahertz radiation from GaAs (100) surface coated with rough Au film.APPLIED SURFACE SCIENCE,285,853.
MLA Wu, XJ,et al."Effect of inhomogeneity and plasmons on terahertz radiation from GaAs (100) surface coated with rough Au film".APPLIED SURFACE SCIENCE 285(2013):853.

入库方式: OAI收割

来源:物理研究所

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