Nanoparticles charge response from electrostatic force microscopy
文献类型：期刊论文
| 作者 | Mottaghizadeh, A ; Lang, PL ; Cui, LM ; Lesueur, J ; Li, J ; Zheng, DN ; Rebuttini, V ; Pinna, N ; Zimmers, A ; Aubin, H |
| 刊名 | APPLIED PHYSICS LETTERS
 |
| 出版日期 | 2013 |
| 卷号 | 102期号:5 |
| ISSN号 | 0003-6951 |
| 通讯作者 | Mottaghizadeh, A (reprint author), ESPCI ParisTech CNRS UPMC, Lab Phys & Etud Mat, UMR 8213, 10 Rue Vauquelin, F-75231 Paris, France. |
| 中文摘要 | Electrostatic force microscopy (EFM) allows measurement of tiny changes in tip-sample capacitance. When nanoobjects are studied by EFM, they only contribute a very small fraction of the total capacitance between the tip and the sample. We show that the analysis of 3D maps of the EFM signal allows extracting the contribution of the nanomaterial to the total capacitance. This opens the way to applications of EFM as a measure of the dielectric coefficient of electrically insulating nanomaterials or the quantum capacitance of conducting nanomaterials. We apply this method to study the charge response of magnetite, Fe3O4, nanoparticles. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4790587] |
| 资助信息 | ANR [10-0409-01, 09-BLAN-0388-01] |
| 语种 | 英语 |
| 公开日期 | 2014-01-16 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/57237]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Mottaghizadeh, A,Lang, PL,Cui, LM,et al. Nanoparticles charge response from electrostatic force microscopy[J]. APPLIED PHYSICS LETTERS,2013,102(5). |
| APA | Mottaghizadeh, A.,Lang, PL.,Cui, LM.,Lesueur, J.,Li, J.,...&Aubin, H.(2013).Nanoparticles charge response from electrostatic force microscopy.APPLIED PHYSICS LETTERS,102(5). |
| MLA | Mottaghizadeh, A,et al."Nanoparticles charge response from electrostatic force microscopy".APPLIED PHYSICS LETTERS 102.5(2013). |
入库方式： OAI收割
来源：物理研究所
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