Thickness dependence of stress in La0.9Sr0.1MnO3 monocrystalline nanofihrns using synchrotron radiation X-ray diffraction
文献类型：期刊论文
| 作者 | Zhang, HD ; Li, ZJ ; Long, YZ ; Xie, HW ; Sun, B ; Lu, HB ; Mai, ZH |
| 刊名 | JOURNAL OF CRYSTAL GROWTH
 |
| 出版日期 | 2013 |
| 卷号 | 366页码:39 |
| ISSN号 | 0022-0248 |
| 关键词 | Nanofilm Residual stress Synchrotron radiation X-ray diffraction Perovskite oxide |
| 通讯作者 | Zhang, HD (reprint author), Qingdao Univ, Coll Phys, Qingdao 266071, Peoples R China. |
| 中文摘要 | Residual stresses in ultrathin La0.9Sr0.1MnO3 (LSMO) films with various thicknesses of 8-40 nm were measured quantitatively via synchrotron radiation X-ray diffraction. By fitting the strain versus sin(2)psi plots the residual stresses in the nanofilms were obtained. With increasing film thickness, both the in- and out-of-plane stresses decreased for strain relaxation. The strains of LSMO nanofilms on miscut SrTiO3 (STO) substrates were weaker than those on exact-cut ones with same thickness, which indicates that the crystallization in nanofilms on miscut SrTiO3 was more perfect than that on exact-cut SrTiO3. The mechanism is discussed briefly based on the minimization of surface energy and strain energy. (C) 2012 Elsevier B.V. All rights reserved. |
| 资助信息 | National Natural Science Foundation of China [11004114, 11074138]; Natural Science Foundation of Shandong Province for Distinguished Young Scholars [JQ201103]; Taishan Scholars Program of Shandong Province, China |
| 语种 | 英语 |
| 公开日期 | 2014-01-17 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/57593]  |
| 专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
| 推荐引用方式 GB/T 7714 | Zhang, HD,Li, ZJ,Long, YZ,et al. Thickness dependence of stress in La0.9Sr0.1MnO3 monocrystalline nanofihrns using synchrotron radiation X-ray diffraction[J]. JOURNAL OF CRYSTAL GROWTH,2013,366:39. |
| APA | Zhang, HD.,Li, ZJ.,Long, YZ.,Xie, HW.,Sun, B.,...&Mai, ZH.(2013).Thickness dependence of stress in La0.9Sr0.1MnO3 monocrystalline nanofihrns using synchrotron radiation X-ray diffraction.JOURNAL OF CRYSTAL GROWTH,366,39. |
| MLA | Zhang, HD,et al."Thickness dependence of stress in La0.9Sr0.1MnO3 monocrystalline nanofihrns using synchrotron radiation X-ray diffraction".JOURNAL OF CRYSTAL GROWTH 366(2013):39. |
入库方式： OAI收割
来源：物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。