STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE
文献类型：期刊论文
| 作者 | DAI, P ; ANGOT, T ; EHRLICH, SN ; WANG, SK ; TAUB, H |
| 刊名 | PHYSICAL REVIEW LETTERS
 |
| 出版日期 | 1994 |
| 卷号 | 72期号:5页码:685 |
| 关键词 | INELASTIC HELIUM SCATTERING ORDERED AR GROWTH MULTILAYERS MONOLAYER GRAPHITE KR |
| ISSN号 | 0031-9007 |
| 通讯作者 | DAI, P (reprint author), UNIV MISSOURI,DEPT PHYS & ASTRON,COLUMBIA,MO 65211, USA. |
| 中文摘要 | Synchrotron x-ray scattering has been used to investigate the structure and growth of xenon films physisorbed on the Ag(111) surface. For growth under quasiequilibrium conditions, the bulk Xe-Xe spacing is reached;at monolayer completion and fcc films of thickness greater-than-or-equal-to 220 angstrom are observed. Under kinetic growth conditions, intensity oscillations in the specular reflectivity as a function of time demonstrate nearly layer-by-layer growth. Modeling of the intensity at a fixed coverage allows profiling of the Xe/vacuum interface as well as a direct determination of the film's thickness and layer spacings. |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2014-02-20 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/57919]  |
| 专题 | 物理研究所_所内人员在其他单位发表论文题录信息_所内人员在其他单位发表论文题录信息_期刊论文 |
| 推荐引用方式 GB/T 7714 | DAI, P,ANGOT, T,EHRLICH, SN,et al. STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE[J]. PHYSICAL REVIEW LETTERS,1994,72(5):685. |
| APA | DAI, P,ANGOT, T,EHRLICH, SN,WANG, SK,&TAUB, H.(1994).STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE.PHYSICAL REVIEW LETTERS,72(5),685. |
| MLA | DAI, P,et al."STRUCTURAL PERFECTION IN PHYSISORBED FILMS - A SYNCHROTRON X-RAY-DIFFRACTION STUDY OF XENON ADSORBED ON THE AG(111) SURFACE".PHYSICAL REVIEW LETTERS 72.5(1994):685. |
入库方式： OAI收割
来源：物理研究所
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