Imaging and identification of atomic planes of cleaved Bi2Sr2CaCu2O8+delta by high resolution scanning tunneling microscopy
文献类型：期刊论文
| 作者 | Pan, SH ; Hudson, EW ; Ma, J ; Davis, JC |
| 刊名 | APPLIED PHYSICS LETTERS
 |
| 出版日期 | 1998 |
| 卷号 | 73期号:1页码:58 |
| 关键词 | SINGLE-CRYSTALS SUPERCONDUCTOR SURFACE STATES |
| ISSN号 | 0003-6951 |
| 通讯作者 | Pan, SH (reprint author), Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA. |
| 中文摘要 | Imaging of the surface of a cleaved Bi2Sr2CaCu2O8+delta (BSCCO) single crystal with a scanning tunneling microscope reveals a series of repeating terraces, whose separations are then used to identify the atomic planes which are exposed. On each of the exp |
| 收录类别 | SCI |
| 语种 | 英语 |
| 公开日期 | 2014-02-20 |
| 源URL | [http://ir.iphy.ac.cn/handle/311004/58104]  |
| 专题 | 物理研究所_所内人员在其他单位发表论文题录信息_所内人员在其他单位发表论文题录信息_期刊论文 |
| 推荐引用方式 GB/T 7714 | Pan, SH,Hudson, EW,Ma, J,et al. Imaging and identification of atomic planes of cleaved Bi2Sr2CaCu2O8+delta by high resolution scanning tunneling microscopy[J]. APPLIED PHYSICS LETTERS,1998,73(1):58. |
| APA | Pan, SH,Hudson, EW,Ma, J,&Davis, JC.(1998).Imaging and identification of atomic planes of cleaved Bi2Sr2CaCu2O8+delta by high resolution scanning tunneling microscopy.APPLIED PHYSICS LETTERS,73(1),58. |
| MLA | Pan, SH,et al."Imaging and identification of atomic planes of cleaved Bi2Sr2CaCu2O8+delta by high resolution scanning tunneling microscopy".APPLIED PHYSICS LETTERS 73.1(1998):58. |
入库方式： OAI收割
来源：物理研究所
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