The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution
文献类型：期刊论文
| 作者 | S. G. Wang ; M. Sun ; K. Long ; Z. D. Zhang |
| 刊名 | Electrochimica Acta
 |
| 出版日期 | 2013 |
| 卷号 | 112页码:371-377 |
| 关键词 | Stainless steel Oxide film XPS SEM Pitting corrosion electrochemical corrosion behavior ray photoelectron-spectroscopy hot-rolled 304-stainless-steel high-temperature water pitting corrosion chloride solution dissolved-oxygen passive films ingot iron xps |
| ISSN号 | 0013-4686 |
| 原文出处 | |
| 语种 | 英语 |
| 公开日期 | 2014-02-19 |
| 源URL | [http://ir.imr.ac.cn/handle/321006/72425]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 推荐引用方式 GB/T 7714 | S. G. Wang,M. Sun,K. Long,et al. The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution[J]. Electrochimica Acta,2013,112:371-377. |
| APA | S. G. Wang,M. Sun,K. Long,&Z. D. Zhang.(2013).The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution.Electrochimica Acta,112,371-377. |
| MLA | S. G. Wang,et al."The electronic structure characterization of oxide film on bulk nanocrystalline 304 stainless teel in hydrochloric acid solution".Electrochimica Acta 112(2013):371-377. |
入库方式： OAI收割
来源：金属研究所
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