Interface and Transport Properties of Metallization Contacts to Flat and Wet-Etching Roughed N-Polar n-Type GaN
文献类型:期刊论文
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作者 | Liancheng Wang, Zhiqiang Liu, Enqing Guo, Hua Yang, Xiaoyan Yi, Guohong Wang |
刊名 | acs applied materials & interfaces
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出版日期 | 2013 ; 2013 |
卷号 | 5期号:12页码:5797–5803 |
学科主题 | 光电子学 ; 光电子学 |
收录类别 | SCI |
公开日期 | 2014-04-09 ; 2014-04-09 |
源URL | [http://ir.semi.ac.cn/handle/172111/24762] ![]() |
专题 | 半导体研究所_中科院半导体照明研发中心 |
推荐引用方式 GB/T 7714 | Liancheng Wang, Zhiqiang Liu, Enqing Guo, Hua Yang, Xiaoyan Yi, Guohong Wang. Interface and Transport Properties of Metallization Contacts to Flat and Wet-Etching Roughed N-Polar n-Type GaN, Interface and Transport Properties of Metallization Contacts to Flat and Wet-Etching Roughed N-Polar n-Type GaN[J]. acs applied materials & interfaces, ACS Applied Materials & Interfaces,2013, 2013,5, 5(12):5797–5803, 5797–5803. |
APA | Liancheng Wang, Zhiqiang Liu, Enqing Guo, Hua Yang, Xiaoyan Yi, Guohong Wang.(2013).Interface and Transport Properties of Metallization Contacts to Flat and Wet-Etching Roughed N-Polar n-Type GaN.acs applied materials & interfaces,5(12),5797–5803. |
MLA | Liancheng Wang, Zhiqiang Liu, Enqing Guo, Hua Yang, Xiaoyan Yi, Guohong Wang."Interface and Transport Properties of Metallization Contacts to Flat and Wet-Etching Roughed N-Polar n-Type GaN".acs applied materials & interfaces 5.12(2013):5797–5803. |
入库方式: OAI收割
来源:半导体研究所
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