中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of co-implantation of nitrogen and fluorine on the fixed positive charge density of the buried oxide layer in SIMOX SOI materials

文献类型:期刊论文

;
作者Zhang Bai-Qiang, Zheng Zhong-Shan, Yu Fang, Ning Jin, Tang Hai-Ma, Yang Zhi-An
刊名acta physica sinica ; Acta Physica Sinica
出版日期2013 ; 2013
卷号62期号:11页码:117303
学科主题光电子学 ; 光电子学
收录类别SCI
语种英语 ; 英语
公开日期2014-04-09 ; 2014-04-09
源URL[http://ir.semi.ac.cn/handle/172111/24714]  
专题半导体研究所_光电子研究发展中心
推荐引用方式
GB/T 7714
Zhang Bai-Qiang, Zheng Zhong-Shan, Yu Fang, Ning Jin, Tang Hai-Ma, Yang Zhi-An. Effect of co-implantation of nitrogen and fluorine on the fixed positive charge density of the buried oxide layer in SIMOX SOI materials, Effect of co-implantation of nitrogen and fluorine on the fixed positive charge density of the buried oxide layer in SIMOX SOI materials[J]. acta physica sinica, Acta Physica Sinica,2013, 2013,62, 62(11):117303, 117303.
APA Zhang Bai-Qiang, Zheng Zhong-Shan, Yu Fang, Ning Jin, Tang Hai-Ma, Yang Zhi-An.(2013).Effect of co-implantation of nitrogen and fluorine on the fixed positive charge density of the buried oxide layer in SIMOX SOI materials.acta physica sinica,62(11),117303.
MLA Zhang Bai-Qiang, Zheng Zhong-Shan, Yu Fang, Ning Jin, Tang Hai-Ma, Yang Zhi-An."Effect of co-implantation of nitrogen and fluorine on the fixed positive charge density of the buried oxide layer in SIMOX SOI materials".acta physica sinica 62.11(2013):117303.

入库方式: OAI收割

来源:半导体研究所

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