Product level accelerated lifetime test for indoor LED luminaires
文献类型：期刊论文
| 作者 | Koh, Sau ; Yuan, Cadmus ; Sun, Bo ; Li, Bob ; Fan, Xuejun ; Zhang, G.Q. |
| 刊名 | 2013 14th international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems, eurosime 2013
 |
| 出版日期 | 2013 |
| 页码 | 6529995 |
| 学科主题 | 光电子学 |
| 收录类别 | EI |
| 语种 | 英语 |
| 公开日期 | 2014-05-16 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/24983]  |
| 专题 | 半导体研究所_集成光电子学国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Koh, Sau,Yuan, Cadmus,Sun, Bo,et al. Product level accelerated lifetime test for indoor LED luminaires[J]. 2013 14th international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems, eurosime 2013,2013:6529995. |
| APA | Koh, Sau,Yuan, Cadmus,Sun, Bo,Li, Bob,Fan, Xuejun,&Zhang, G.Q..(2013).Product level accelerated lifetime test for indoor LED luminaires.2013 14th international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems, eurosime 2013,6529995. |
| MLA | Koh, Sau,et al."Product level accelerated lifetime test for indoor LED luminaires".2013 14th international conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems, eurosime 2013 (2013):6529995. |
入库方式： OAI收割
来源：半导体研究所
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