Changes of optical, dielectric, and structural properties of Si15Sb85 phase change memory thin films under different initializing laser power
文献类型：期刊论文
| 作者 | Huang Huan(黄欢) ; Zhang Lei(张雷) ; Wang Yang(王阳) ; Han Xiao Dong(韩晓东) ; Wu Yiqun(吴谊群) ; Zhang Ze(张泽) ; Gan Fuxi(干福熹) |
| 刊名 | journal of alloys and compounds
 |
| 出版日期 | 2011-02-12 |
| 期号 | 509页码:5050-5054 |
| 关键词 | SiSb phase change film |
| 合作状况 | 其它 |
| 学科主题 | 光学 |
| 收录类别 | 其他 |
| 语种 | 中文 |
| WOS记录号 | WOS:000289372300007 |
| 公开日期 | 2011-03-30 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/7015]  |
| 专题 | 上海光学精密机械研究所_高密度光存储技术实验室 |
| 推荐引用方式 GB/T 7714 | Huang Huan,Zhang Lei,Wang Yang,et al. Changes of optical, dielectric, and structural properties of Si15Sb85 phase change memory thin films under different initializing laser power[J]. journal of alloys and compounds,2011(509):5050-5054. |
| APA | Huang Huan.,Zhang Lei.,Wang Yang.,Han Xiao Dong.,Wu Yiqun.,...&Gan Fuxi.(2011).Changes of optical, dielectric, and structural properties of Si15Sb85 phase change memory thin films under different initializing laser power.journal of alloys and compounds(509),5050-5054. |
| MLA | Huang Huan,et al."Changes of optical, dielectric, and structural properties of Si15Sb85 phase change memory thin films under different initializing laser power".journal of alloys and compounds .509(2011):5050-5054. |
入库方式： OAI收割
来源：上海光学精密机械研究所
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