Shape effects on the yield stress and deformation of silicon nanowires: A molecular dynamics simulation
文献类型:期刊论文
作者 | Yang ZY(杨振宇); Lu ZX(卢子兴); Zhao YP(赵亚溥) |
刊名 | Journal of Applied Physics |
出版日期 | 2009 |
卷号 | 106期号:2页码:023537 |
通讯作者邮箱 | yzhao@imech.ac.cn |
ISSN号 | 0021-8979 |
通讯作者 | 赵亚溥 |
合作状况 | 其它 |
中文摘要 | The tension and compression of single-crystalline silicon nanowires (SiNWs) with different cross-sectional shapes are studied systematically using molecular dynamics simulation. The shape effects on the yield stresses are characterized. For the same surface to volume ratio, the circular cross-sectional SiNWs are stronger than the square cross-sectional ones under tensile loading, but reverse happens in compressive loading. With the atoms colored by least-squares atomic local shear strain, the deformation processes reveal that the failure modes of incipient yielding are dependent on the loading directions. The SiNWs under tensile loading slip in {111} surfaces, while the compressive loading leads the SiNWs to slip in the {110} surfaces. The present results are expected to contribute to the design of the silicon devices in nanosystems. |
学科主题 | 固体力学 |
类目[WOS] | Physics, Applied |
研究领域[WOS] | Physics |
关键词[WOS] | SEMICONDUCTOR NANOWIRES ; ELASTIC PROPERTIES ; STRENGTH ; SURFACES ; STRAIN |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000268613000063 |
公开日期 | 2009-12-28 |
源URL | [http://dspace.imech.ac.cn/handle/311007/28812] |
专题 | 力学研究所_非线性力学国家重点实验室 |
推荐引用方式 GB/T 7714 | Yang ZY,Lu ZX,Zhao YP. Shape effects on the yield stress and deformation of silicon nanowires: A molecular dynamics simulation[J]. Journal of Applied Physics,2009,106(2):023537. |
APA | 杨振宇,卢子兴,&赵亚溥.(2009).Shape effects on the yield stress and deformation of silicon nanowires: A molecular dynamics simulation.Journal of Applied Physics,106(2),023537. |
MLA | 杨振宇,et al."Shape effects on the yield stress and deformation of silicon nanowires: A molecular dynamics simulation".Journal of Applied Physics 106.2(2009):023537. |
入库方式: OAI收割
来源:力学研究所
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