Preparation and electrical properties of mn-co-ni-o thin-film for ntc thermistors application
文献类型:会议论文
作者 | WangLei![]() |
出版日期 | 2013 |
会议名称 | Chinese Materials Congress 2012, CMC 2012 |
会议日期 | July 13, 2012 - July 18, 2012 |
会议地点 | Taiyuan, China |
页码 | 599-604 |
通讯作者 | Chen, X.(chenxueying_123_2006@126.com) |
中文摘要 | Mn-Co-Ni-O (Mn:Co:Ni=1.74:0.72:0.54, MCN) thin films with single cubic spinel structure were prepared on Si substrates by metal organic solution deposition (MOSD) method at different annealing temperatures. The effects of annealing temperature on the phase component, crystalline microstructure, surface morphology and electrical properties of the MCN thin films were studied. According to the results of x-ray diffraction pattern, the MCN thin film annealed at 650°C had spinel structure. Observation with field emission scanning electron microscope (FE-SEM) on the MCN thin films showed that the grain size increased with increasing annealing temperature. The resistance measured at room-temperature was 18.143, 12.457, 2.435 and 3.141MΩ for the MCN thin films annealed at 650, 700, 750 and 800°C respectively. The values of thermistor constant (B |
收录类别 | EI |
会议录出版地 | Trans Tech Publications Ltd, Kreuzstrasse 10, Zurich-Durnten, CH-8635, Switzerland |
语种 | 英语 |
ISSN号 | 2555476 |
ISBN号 | 9783037856079 |
源URL | [http://ir.xjipc.cas.cn/handle/365002/3620] ![]() |
专题 | 新疆理化技术研究所_材料物理与化学研究室 |
推荐引用方式 GB/T 7714 | WangLei. Preparation and electrical properties of mn-co-ni-o thin-film for ntc thermistors application[C]. 见:Chinese Materials Congress 2012, CMC 2012. Taiyuan, China. July 13, 2012 - July 18, 2012. |
入库方式: OAI收割
来源:新疆理化技术研究所
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